Web-Based Environment for Digital Electronics Test Tools

  • Eero Ivask
  • Jaan Raik
  • Raimund Ubar
  • Andre Schneider
Conference paper
Part of the IFIP International Federation for Information Processing book series (IFIPAICT, volume 149)

Abstract

This paper describes a concept and implementation of the web-based environment for providing access over the Internet to existing stand-alone digital electronics test tools. On the user side only ordinary web browser is sufficient. The environment is built according to the client- server three-tier concept using HTML, Java applets/servlets and MySQL as database backend for user tracking and management tasks. In this paper we discuss integration of two software systems into web- based environment. The paper presents the workflows that can be executed over the Internet and gives the experimental results for estimating the efficiency of the hierarchical ATPG.

References

  1. 2.
    Niermann TM, Patel J. “HITEC: A test generation package for sequential circuits”, Proc. European Conf. Design Automation (EDAC), pp.214–218, 1991Google Scholar
  2. 3.
    Raik J, Ubar R. “Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations.”, JETTA, Kluwer Academic Publishers. Vol. 16, No. 3, pp. 213–226, June, 2000Google Scholar
  3. 4.
    Rudnick EM, Patel J, Greenstein GS. T.M. Niermann: Sequential Circuit Test Generation in a Genetic Algorithm framework. DAC., pp. 698–704, 1994Google Scholar
  4. 5.
    Schneider A et. al. Internet-based Collaborative Test Generation with MOSCITO. Proc. of DATE’02, Paris, France, March 4–8, 2002, pp.221–226.Google Scholar
  5. 7.
    Ubar R. Multi-Valued Simulation of Digital Circuits with Structurally Synthesized BDDs. OPA N.V. Gordon & Breach Publ, Multiple Valued Logic, Vol.4, pp. 141–157, 1998MATHGoogle Scholar

Copyright information

© Springer Science + Business Media, Inc. 2004

Authors and Affiliations

  • Eero Ivask
    • 1
  • Jaan Raik
    • 1
  • Raimund Ubar
    • 1
  • Andre Schneider
    • 2
  1. 1.Tallinn Technical UniversityEstonia
  2. 2.Fraunhofer Inst. for Integr. CircuitsGermany

Personalised recommendations