Nanoscale Structural and Magnetic Characterization Using Electron Microscopy
The transmission electron microscope (TEM) is a powerful instrument for structural, chemical and magnetic characterization at the nanoscale. Imaging, diffraction and microanalytical information can be combined with complementary micromagnetic information to provide a more thorough understanding of magnetic behavior. The first part of this chapter provides a brief overview of TEM operating modes that are suitable for examination of magnetic materials. The latter part provides examples that serve to illustrate the diverse range of materials that can be usefully studied.
KeywordsTunnel Junction Vortex State Nanoscale Structural Magnetic Tunnel Junction Transmission Electron Microscope Specimen
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- R. E. Dunin-Borkowski, M. R. McCartney, and D. J. Smith, in “Encyclopedia of Nanoscience and Nanotechnology”, Ed. H.S. Nalwa, American Scientific, Stevenson Ranch 2003, Volume X, Pp. 1–59.Google Scholar