Abstract
Electron microscope (EM) uses high-energy electron beam as probe instead of visible light. The electrons have shorter wavelength and provides very high-resolution capacity (0.1 nm) and 500,000 times magnification power. It is also easy to manipulate the electron beams. Instead of glass as lens, the electron microscope uses electromagnetic coil as condenser and objectives. This chapter covers the principle, essential components, microscope column and electronic optics of EM. The chapter also describes the specimen and electron interaction. In addition the collection, processing and staining for EM have also been described.
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Dey, P. (2018). Electron Microscopy: Principle, Components, Optics and Specimen Processing. In: Basic and Advanced Laboratory Techniques in Histopathology and Cytology. Springer, Singapore. https://doi.org/10.1007/978-981-10-8252-8_26
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DOI: https://doi.org/10.1007/978-981-10-8252-8_26
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Publisher Name: Springer, Singapore
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Online ISBN: 978-981-10-8252-8
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