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Optoelectronic Characterization of Epitaxial Films of Electrodeposited CdSe Quantum Dots

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Fine Particles Science and Technology

Part of the book series: NATO ASI Series ((ASHT,volume 12))

Abstract

Optical and electrical properties of films of CdSe quantum dots epitaxially electrodeposited onto gold have been measured by modulated optical spectroscopy, liquid junction photoresponse spectroscopy and local current-voltage spectroscopy using a metallized scanning probe tip. The blue shift in the bandgap resulting from quantum confinement in the quantum dots has been measured by all these techniques. Large differences in the charge collection efficiency between the first and subsequent layers of dots have been measured and explained by the positive role of grain boundaries in enhancing collection efficiency in these films. Single electron transfer through the dots has been observed and explained by the large charging energies of the very small (4–5nm) dots.

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© 1996 Kluwer Academic Publishers

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Alperson, B., Cohen, S., Golan, Y., Rubinstein, I., Hodes, G. (1996). Optoelectronic Characterization of Epitaxial Films of Electrodeposited CdSe Quantum Dots. In: Pelizzetti, E. (eds) Fine Particles Science and Technology. NATO ASI Series, vol 12. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0259-6_40

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  • DOI: https://doi.org/10.1007/978-94-009-0259-6_40

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-4047-8

  • Online ISBN: 978-94-009-0259-6

  • eBook Packages: Springer Book Archive

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