Abstract
In this chapter, we review results obtained by conventional and advanced electron microscopy related techniques of complex 1-D nanostructures such as spontaneous core–shell AlxGa 1−x N/GaN (0001) nanowires, ZnO/Si(111) nanorods, ZnO/CdTe (111) nanowires, and InAsxP1−x/InP(001) quantum wires.
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Acknowledgments
Financial support from Spanish projects (MAT2010-15206, TEC2011-29120-C05-03 and CONSOLIDER INGENIO 2010 CSD2009-00013), Junta de Andalutia (P09-TEP-5403, PAI research groups TEP-120 and TEP-946), and the European Science Foundation (COST Action MP0805) are gratefully acknowledged. TEM measurements were carried out at DME-SCCYT-UCA. The authors would like to thank their collaborators and coauthors of the articles reviewed here (O. Martinez, J.L. Plaza, E. Dieguez, J.G. Lozano, J. Mass, D. Byrne, E. McGlyn, B. Twamley, M. O. Henry, P.L. Galindo, J. Pizarro, D. Fuster, L. González, Y. González, S. Kret, R. Songmuang, M. H. Gass, P. J. Goodhew, M. Varela, S. J. Pennycook). Authors belong to the Institute of Electron Microscopy and Materials, which is in interim stage of creation.
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Ben, T., Allah, R.F., Sales, D.L., González, D., Molina, S.I. (2014). Transmission Electron Microscopy of 1D-Nanostructures. In: Kumar, C. (eds) Transmission Electron Microscopy Characterization of Nanomaterials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38934-4_14
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