Abstract
The terahertz (THz) frequency range has proven to be a very interesting frequency range for imaging applications. The smallest spatial features that can theoretically be resolved is limited by diffraction to values of about half of a wavelength, which corresponds to 150 \(\upmu \)m for a frequency of 1 THz. To overcome this diffraction limit, THz near-field techniques have been developed. Some of these techniques are unique for the THz frequency range and others are derived from similar techniques used in, for example, the visible region of the electromagnetic spectrum. An interesting feature of many of these near-field techniques is that they measure the electric field rather than the intensity. This makes it also possible to study the near-electromagnetic field itself with a resolving power, as defined as the ratio of the spatial resolution to the wavelength, and bandwidth which are practically unobtainable in the visible region of the electromagnetic spectrum. This chapter describes a number of different techniques to overcome the diffraction limit in the THz frequency range and also the results that have been obtained with them.
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Planken, P.C.M., Adam, A.J.L., Kim, D. (2012). Terahertz Near-Field Imaging. In: Peiponen, KE., Zeitler, A., Kuwata-Gonokami, M. (eds) Terahertz Spectroscopy and Imaging. Springer Series in Optical Sciences, vol 171. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-29564-5_15
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