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Fabrication and Characterizations of Bi2Te3 Based Topological Insulator Nanomaterials

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Outlook and Challenges of Nano Devices, Sensors, and MEMS

Abstract

In this manuscript, recent experimental research progresses in topological insulators Bi2Se3 and Bi2Te3 based nanostructures are presented, with a focus on nanoflakes, nanoplates, nanosheets, nanowires, and thin films of Bi2Te3 based topological insulator materials. Among the various synthesis methods, the chemical vapor deposition (CVD) method is described here as an example for the synthesis of topological insulator nanomaterials. The Raman spectroscopy and electrical transport characterizations are discussed on a few different types of topological insulators, such as binary/ternary/quaternary compound and elementally-doped nanostructures and films.

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Acknowledgements

The authors thank Rui He, CheeHuei Lee, Dong Liang, Richard L.J. Qiu, Mohan Sankaran, Hao Tang for collaborations. Z.D. Zhang and Z.H. Wang thank the National Natural Science Foundation of China with Grant No. 51331006 and 51522104. X.P.A. Gao thanks the National Science Foundation (DMR-1151534) of U.S. for funding support.

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Authors and Affiliations

  1. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang, 110016, People’s Republic of China

    Z. H. Wang & Z. D. Zhang

  2. Department of Physics, Case Western Reserve University, Cleveland, OH, 44106, USA

    Xuan P. A. Gao

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  1. State Key Lab of Electronic Thin Film & Integrated Device, University of Electronic Science & Technology of China, Chengdu, China

    Ting Li

  2. Microelectronics & Solid-state Electronics College, University of Electronic Science & Technology of China, Chengdu, China

    Ziv Liu

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Wang, Z.H., Gao, X.P.A., Zhang, Z.D. (2017). Fabrication and Characterizations of Bi2Te3 Based Topological Insulator Nanomaterials. In: Li, T., Liu, Z. (eds) Outlook and Challenges of Nano Devices, Sensors, and MEMS. Springer, Cham. https://doi.org/10.1007/978-3-319-50824-5_15

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