Abstract
Electromagnetic waves have been recently pointed out as a medium for fault injection within circuits featuring cryptographic modules. Indeed, it has been experimentally demonstrated by A. Dehbaoui et al. [3] that an electromagnetic pulse, produced with a high voltage pulse generator and a probe similar to that used to perform EM analyses, was susceptible to create faults exploitable from a cryptanalysis viewpoint. An analysis of the induced faults [4] revealed that they originated from timing constraint violations.
This paper experimentally demonstrates that EM injection, performed with enhanced probes is very local and can produce not only timing faults but also bit-set and bit-reset faults. This result clearly extends the range of the threats associated with EM fault injection.
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Ordas, S., Guillaume-Sage, L., Tobich, K., Dutertre, JM., Maurine, P. (2015). Evidence of a Larger EM-Induced Fault Model. In: Joye, M., Moradi, A. (eds) Smart Card Research and Advanced Applications. CARDIS 2014. Lecture Notes in Computer Science(), vol 8968. Springer, Cham. https://doi.org/10.1007/978-3-319-16763-3_15
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DOI: https://doi.org/10.1007/978-3-319-16763-3_15
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