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Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays

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Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 162))

Abstract

We observe the electron velocity/momentum distributions due to three-photon ionization and strong-field photoemission from Si-nanotip arrays using velocity map imaging.

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Acknowledgments

The authors like to thank Nele L.M. Müller for many helpful discussion on photocathode emittance measurements.

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Correspondence to Hong Ye .

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© 2015 Springer International Publishing Switzerland

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Ye, H. et al. (2015). Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays. In: Yamanouchi, K., Cundiff, S., de Vivie-Riedle, R., Kuwata-Gonokami, M., DiMauro, L. (eds) Ultrafast Phenomena XIX. Springer Proceedings in Physics, vol 162. Springer, Cham. https://doi.org/10.1007/978-3-319-13242-6_163

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