Quantitative Thermal Transport Measurements in Nanostructures

Abstract

Based on the experimental and analytical framework developed in the previous chapter, we develop here the requirements needed for quantitative comparison and estimation of thermal properties. Using an analytical model for the thermal spreading resistance in the sample, quantities such as thermal conductivity and interface thermal resistance can be deduced from SThM measurements. We apply similar models to relatively simple samples, oxide layers on silicon substrates to demonstrate the principles underlying these models. Finally, metal covered block copolymers thin films are mapped and their thermal resistances measured to extract effective thermal conductivities.