Skip to main content

The Theory of the Formation and Nature of Radiation-Induced Defects

  • Chapter
Radiation Effects in Semiconductors and Semiconductor Devices
  • 302 Accesses

Abstract

The term ‘radiation-induced defects’ refers to relatively stable lattice imperfections, produced by high-energy particles. Since single crystals are perfect bodies, their electrical and optical properties are strongly influenced by radiation-induced defects. Extensive studies on the influence of high-energy radiation on semiconductors have been carried out during the last fifteen years. Many of the investigations are concerned not only with general problems of semiconductor physics, but also with practical problems. An example of this is the study of the radiation stability of solar silicon cells used in space explorations.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1977 Consultants Bureau, New York

About this chapter

Cite this chapter

Vavilov, V.S., Ukhin, N.A. (1977). The Theory of the Formation and Nature of Radiation-Induced Defects. In: Radiation Effects in Semiconductors and Semiconductor Devices. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-9069-5_1

Download citation

  • DOI: https://doi.org/10.1007/978-1-4684-9069-5_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-9071-8

  • Online ISBN: 978-1-4684-9069-5

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics