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The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems

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Modeling Nanoscale Imaging in Electron Microscopy

Part of the book series: Nanostructure Science and Technology ((NST))

Abstract

In this chapter, the basic principles of atomic resolution scanning transmission electron microscopy (STEM) will be described. Particular attention will be paid to the benefits of the incoherent Z-contrast imaging technique for structural determination and the benefits of aberration correction for improved spatial resolution and sensitivity in the acquired images. In addition, the effect that the increased beam current in aberration corrected systems has on electron beam-induced structural modifications of inorganic systems will be discussed. Procedures for controlling the electron dose will be described along with image processing methods that enable quantified information to be extracted from STEM images. Several examples of the use of aberration-corrected STEM for the study of nanoscale systems will be presented; a quantification of vacancies in clathrate systems, a quantification of N doping in GaAs, a quantification of the size distribution in nanoparticle catalysts, and an observation of variability in dislocation core composition along a low-angle grain boundary in SrTiO3. The potential for future standardized methods to reproducibly quantify structures determined by STEM and/or high-resolution TEM will also be discussed.

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Acknowledgments

This work was supported in part by the U.S. Department of Energy under grant number DE-FG02–03ER46057 and by the U.S. National Science Foundation under grant number CTS-0500511. Aspects of this work were also performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory and supported by the Office of Science, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, of the U.S. Department of Energy under Contract DE-AC52–07NA27344. Experiments were also performed at two DOE user facilities: the National Center for Electron Microscopy (NCEM) at Lawrence Berkeley National Laboratory, and the SHaRE facility at Oak Ridge National Laboratory. The Clathrate work described in this paper was performed in collaboration with D. Neiner and S. M. Kauzlarich, the work on size distributions in catalysts was performed with B. C. Gates, and A. Kulkarni, the work on N-doped GaAs was performed in collaboration with D. Gonzalez, J. Pizarro, A. Yáñez, P. Galindo, R. Garcia, M.-H. Du, S.B. Zhang, and M. Hopkinson, and the work on SrTiO3 grain boundaries was performed with J. P. Bradley and B. Jiang.

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Authors and Affiliations

  1. Department of Chemical Engineering and Materials Science, University of California-Davis, One Shields Ave, Davis, CA, 95618, USA

    N. D. Browning, D. J. Masiel & D. G. Morgan

  2. Department of Molecular and Cellular Biology, University of California-Davis, One Shields Ave, Davis, CA, 95618, USA

    N. D. Browning, J. P. Buban & S. Mehraeen

  3. Chemical and Materials Sciences Division, Pacific Northwest National Laboratory, 902 Battelle Boulevard, Richland, WA, 99352, USA

    N. D. Browning

  4. Materials Science Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA

    M. Chi

  5. C-CINA, Biozentrum, University Basel, WRO-1058 Mattenstrasse, CH-4058, Basel, Switzerland

    B. Gipson & H. Stahlberg

  6. Departamento de Ciencia de los Materiales e Ingeniería Metalurgica y Química Inorgánica, Facultad de Ciencias, Universidad de Cádiz, Pol. Rio San Pedro, 11510, Puerto Real (Cádiz), Spain

    M. Herrera

  7. Department of Materials Science and Engineering, Kyoto University, Yoshida, Sakyo-ku, Kyoto, 606–8501, Japan

    N. L. Okamoto

  8. Condensed Matter and Materials Division, Physical and Life Sciences Directorate, Lawrence Livermore National Laboratory, 808, Livermore, CA, 94550, USA

    B. W. Reed

  9. SuperSTEM Laboratory, J Block, STFC Daresbury, Daresbury, WA4 4AD, UK

    Q. M. Ramasse

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  12. H. Stahlberg
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Correspondence to N. D. Browning .

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Editors and Affiliations

  1. NanoCenter, Dept. of Chemistry & Biochem., University of South Carolina, Greene Street 1212, Columbia, 29208, South Carolina, USA

    Thomas Vogt

  2. , Dept. of Mathematics, Inst. Geometrie & Praktische Mathemat., Templergraben 55, Aachen, 52056, Germany

    Wolfgang Dahmen

  3. Interdisciplin. Mathematics Instit., Dept. Mathematics, University of South Carolina, Greene Street 1523, Columbia, 29208, South Carolina, USA

    Peter Binev

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© 2012 Springer Science+Business Media, LLC

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Browning, N.D. et al. (2012). The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems. In: Vogt, T., Dahmen, W., Binev, P. (eds) Modeling Nanoscale Imaging in Electron Microscopy. Nanostructure Science and Technology. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-2191-7_2

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