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Scanning Transmission Electron Microscopy for Nanostructure Characterization

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Author information

Authors and Affiliations

  1. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    S. J. Pennycook

  2. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    A. R. Lupini

  3. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    M. Varela

  4. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    A. Borisevich

  5. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    Y. Peng

  6. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    M. P. Oxley

  7. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    K. Van Benthem

  8. Oak Ridge National Laboratory, 2008, 37831, Oak Ridge, TN

    M. F. Chisholm

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  1. S. J. Pennycook
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Editor information

Editors and Affiliations

  1. College of Sciences, University of New Orleans, 70148, New Orleans, Louisiana, USA

    Weilie Zhou

  2. Center of Nanotechnology and Nanoscience, Georgia Institute of Technology, 30332-0245, Atlanta, Georgia, USA

    Zhong Lin Wang

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Pennycook, S.J. et al. (2006). Scanning Transmission Electron Microscopy for Nanostructure Characterization. In: Zhou, W., Wang, Z.L. (eds) Scanning Microscopy for Nanotechnology. Springer, New York, NY. https://doi.org/10.1007/978-0-387-39620-0_6

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