Overview
- Covers IC design, noise modeling and characterization, electromagnetism, packaging and EMC measurements
- Includes standardized measurement methods, standardized modeling approaches, and dedicated tools
- Includes supplementary material: sn.pub/extras
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Table of contents (7 chapters)
Keywords
About this book
Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.
Editors and Affiliations
Bibliographic Information
Book Title: Electromagnetic Compatibility of Integrated Circuits
Book Subtitle: Techniques for low emission and susceptibility
Editors: Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
DOI: https://doi.org/10.1007/b137864
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2006
Hardcover ISBN: 978-0-387-26600-8Published: 09 December 2005
Softcover ISBN: 978-1-4614-9831-5Published: 19 November 2014
eBook ISBN: 978-0-387-26601-5Published: 04 June 2006
Edition Number: 1
Number of Pages: XIII, 473
Topics: Microwaves, RF and Optical Engineering, Electronics and Microelectronics, Instrumentation, Circuits and Systems, Automotive Engineering, Computer-Aided Engineering (CAD, CAE) and Design