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Table of contents

  1. Front Matter
  2. Martin Schmidbauer
    Pages 1-6
  3. Martin Schmidbauer
    Pages 69-94
  4. Martin Schmidbauer
    Pages 95-126
  5. Martin Schmidbauer
    Pages 139-164
  6. Martin Schmidbauer
    Pages 165-186
  7. Martin Schmidbauer
    Pages 187-198
  8. Martin Schmidbauer
    Pages 199-202
  9. Back Matter

About this book

Introduction

This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

Keywords

Mesoscopic systems Self-organized growth Semiconductor Semiconductors nanostructures X-ray diffuse scattering quantum dot scattering

Authors and affiliations

  • Martin Schmidbauer
    • 1
  1. 1.Institut für Physik Röntgenbeugung an SchichtsystemenHumboldt-Universität zu BerlinBerlinGermany

Bibliographic information

  • DOI https://doi.org/10.1007/b13608
  • Copyright Information Springer-Verlag Berlin Heidelberg 2004
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-20179-3
  • Online ISBN 978-3-540-39986-5
  • Series Print ISSN 0081-3869
  • Series Online ISSN 1615-0430
  • Buy this book on publisher's site