Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

1. Front Matter

   Pages i-xviii

   PDF

2. Introduction to Testing

   1. Front Matter

      Pages 1-1

      PDF

   2. Introduction

      Pages 3-16

   3. VLSI Testing Process and Test Equipment

      Pages 17-34

   4. Test Economics and Product Quality

      Pages 35-55

   5. Fault Modeling

      Pages 57-80

3. Test Methods

   1. Front Matter

      Pages 81-81

      PDF

   2. Logic and Fault Simulation

      Pages 83-128

   3. Testability Measures

      Pages 129-154

   4. Combinational Circuit Test Generation

      Pages 155-210

   5. Sequential Circuit Test Generation

      Pages 211-252

   6. Memory Test

      Pages 253-308

   7. DSP-Based Analog and Mixed-Signal Test

      Pages 309-384

   8. Model-Based Analog and Mixed-Signal Test

      Pages 385-416

   9. Delay Test

      Pages 417-438

   10. IDDQ Test

       Pages 439-462

4. Design for Testability

   1. Front Matter

      Pages 463-463

      PDF

   2. Digital DFT and Scan Design

      Pages 465-488

   3. Built-In Self-Test

      Pages 489-548

   4. Boundary Scan Standard

      Pages 549-574

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

• Standard
• VLSI
• boundary scan
• digital signal processor
• drift transistor
• integrated circuit
• logic
• modeling
• simulation
• stability

• Rutgers University, USA

  Michael L. Bushnell

• Bell Labs, Lucent Technologies, USA

  Vishwani D. Agrawal