System Analysis and Modeling

4th International SDL and MSC Workshop, SAM 2004, Ottawa, Canada, June 1-4, 2004, Revised Selected Papers

  • Daniel Amyot
  • Alan W. Williams
Conference proceedings SAM 2004

DOI: 10.1007/b105884

Part of the Lecture Notes in Computer Science book series (LNCS, volume 3319)

Table of contents

  1. Front Matter
  2. SDL and eODL

    1. Andreas Hoffmann, Bertram Neubauer
      Pages 1-16
    2. Harald Böhme, Joachim Fischer
      Pages 17-32
    3. Margarita de Cabo, Manuel Rodríguez
      Pages 33-49
    4. Jörg Dorsch, Anders Ek, Reinhard Gotzhein
      Pages 50-64
  3. Evolution of Languages

    1. Øystein Haugen
      Pages 65-79
    2. Edel Sherratt
      Pages 96-105
  4. Requirements and MSC

    1. Ferhat Khendek, Christophe Lohr, Li Xin Wang, Xiao Jun Zhang, Tong Zheng
      Pages 106-121
    2. Bill Mitchell, Robert Thomson, Paul Bristow
      Pages 122-137
    3. Jameleddine Hassine, Rachida Dssouli, Juergen Rilling
      Pages 138-153
  5. Security

  6. SDL and Modelling

    1. Joachim Fischer, Michael Piefel, Markus Scheidgen
      Pages 208-223
    2. Ingmar Fliege, Alexander Geraldy, Reinhard Gotzhein, Philipp Schaible
      Pages 224-236
    3. Rolv Bræk, Jacqueline Floch
      Pages 237-256
  7. Experience

    1. Frank Weil, Thomas Weigert
      Pages 271-289
    2. Paresh Jain, Amresh Nandan
      Pages 290-300

About these proceedings

Keywords

SDL SDL specifications Text UML description languages distributed systems formal specification network software development process communication languages protocol design requirements engineering systems modeling systems security

Editors and affiliations

  • Daniel Amyot
    • 1
  • Alan W. Williams
    • 2
  1. 1.SITEUniversity of OttawaOttawaCanada
  2. 2.University of OttawaOttawaCanada

Bibliographic information

  • Copyright Information Springer-Verlag Berlin Heidelberg 2005
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science
  • Print ISBN 978-3-540-24561-2
  • Online ISBN 978-3-540-31810-1
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349