Overview
Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 682)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
Keywords
About this book
The piezojunction effect is caused by a stress-induced change in the conductivity of the minority-charge carriers, while the piezoresistive effect is caused by a similar effect for the majority-charge carriers. To characterise the anisotropic piezojunction effect, the authors performed systematic investigations over wide ranges of mechanical stress and temperature. The experiments have been performed for various crystal and stress orientations. The experimental results have been used to extract the first- and second-order piezojunction (FOPJ and SOPJ) coefficients for bipolar transistors.
It is shown how the knowledge of the piezojunction and piezoresistive coefficients can used to minimize the undesirable mechanical-stress effects on the electrical characteristics of transistors and resistors, respectively. Devices with lower mechanical-stress sensitivity can be found by comparing their piezo-coefficients. The layout of the device can also be optimized to reduce the mechanical-stress sensitivity.
As a next step it is shown, how the knowledge of the piezo-effects on device level can be used to predict and to reduce their negative influence on circuit level. This is demonstrated for a number of important basic circuits, including translinear circuits, temperature transducers and bandgap references.
Finally, it is shown how the piezojunction effect can be used to fabricate stress-sensing elements. It appears that, in comparison with resistive stress-sensing elements, the piezojunction sensors have the advantage of a smaller size and very low power dissipation.
Authors and Affiliations
Bibliographic Information
Book Title: The Piezojunction Effect in Silicon Integrated Circuits and Sensors
Authors: Fabiano Fruett, Gerard C. M. Meijer
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/b101922
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2002
Hardcover ISBN: 978-1-4020-7053-2Published: 31 May 2002
Softcover ISBN: 978-1-4419-5282-0Published: 09 December 2010
eBook ISBN: 978-0-306-48210-6Published: 18 April 2006
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XII, 162
Topics: Circuits and Systems, Electrical Engineering, Optical and Electronic Materials