Particle Induced Electron Emission I

  • Editors
  • Max Rösler
  • Wolfram Brauer
  • Jacques Devooght
  • Jean-Claude Dehaes
  • Alain Dubus
  • Michel Cailler
  • Jean-Pierre Ganachaud

Part of the Springer Tracts in Modern Physics book series (STMP, volume 122)

Table of contents

About this book

Introduction

This monograph discusses collision-induced electron emission from nearly free-electron metals by ion or electron impact. This subject is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. Several electron excitation mechanisms of electrons in the target are considered: excitation of single conduction and core electrons, excitation by plasmon decay and by Auger processes. Transport of inner excited electrons is simulated by the Boltzmann equation incorporating both elastic and inelastic collisions. The numerical calculation of scattering rates uses a dynamically screened Coulomb interaction. These results for the energy distributions of emerging electrons as well as the electron yield are compared with recent experimental measurements on electron emission from polycrystalline aluminum.

Keywords

Elektronenausbeute Elektronenemission Elektronenspektroskopie Secondary electron emission Sekundärelektronenemission Teilchenphysik crystal electron electron spectroscopy microscopy pr protoneninduzierte Elektronenemission scattering spectroscopy transport

Bibliographic information

  • DOI https://doi.org/10.1007/BFb0041376
  • Copyright Information Springer-Verlag Berlin Heidelberg 1991
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-53431-0
  • Online ISBN 978-3-540-48723-4
  • Series Print ISSN 0081-3869
  • Series Online ISSN 1615-0430
  • About this book