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LabVIEW based Automation Guide for Microwave Measurements

  • Satya Kesh Dubey
  • Naina Narang
  • P. S. Negi
  • V. N. Ojha

Part of the SpringerBriefs in Electrical and Computer Engineering book series (BRIEFSELECTRIC)

Also part of the SpringerBriefs in Computational Electromagnetics book sub series (BRIEFSCE)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. SatyaKesh Dubey, Naina Narang, Parmendra Singh Negi, Vijay Narain Ojha
    Pages 1-2
  3. SatyaKesh Dubey, Naina Narang, Parmendra Singh Negi, Vijay Narain Ojha
    Pages 3-9
  4. SatyaKesh Dubey, Naina Narang, Parmendra Singh Negi, Vijay Narain Ojha
    Pages 11-24
  5. SatyaKesh Dubey, Naina Narang, Parmendra Singh Negi, Vijay Narain Ojha
    Pages 25-34
  6. SatyaKesh Dubey, Naina Narang, Parmendra Singh Negi, Vijay Narain Ojha
    Pages 35-42
  7. SatyaKesh Dubey, Naina Narang, Parmendra Singh Negi, Vijay Narain Ojha
    Pages 43-43
  8. Back Matter
    Pages 45-45

About this book

Introduction

The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). 

Keywords

Microwave measurement Automation Attenuation Scattering parameters Electric field Uncertainty LabVIEW

Authors and affiliations

  • Satya Kesh Dubey
    • 1
  • Naina Narang
    • 2
  • P. S. Negi
    • 3
  • V. N. Ojha
    • 4
  1. 1.Microwave Standards, TFEEMDCSIR-National Physical Laboratory of IndiaNew DelhiIndia
  2. 2.CSIR-National Physical Laboratory of IndiaNew DelhiIndia
  3. 3.CSIR-National Physical Laboratory of IndiaNew DelhiIndia
  4. 4.Microwave Standards, TFEEMDCSIR-National Physical Laboratory of IndiaNew DelhiIndia

Bibliographic information

  • DOI https://doi.org/10.1007/978-981-10-6280-3
  • Copyright Information The Author(s) 2018
  • Publisher Name Springer, Singapore
  • eBook Packages Engineering
  • Print ISBN 978-981-10-6279-7
  • Online ISBN 978-981-10-6280-3
  • Series Print ISSN 2191-8112
  • Series Online ISSN 2191-8120
  • Buy this book on publisher's site