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Transmission Electron Microscopy

Physics of Image Formation and Microanalysis

  • Ludwig Reimer

Part of the Springer Series in Optical Sciences book series (SSOS, volume 36)

Table of contents

  1. Front Matter
    Pages I-XIII
  2. Ludwig Reimer
    Pages 1-18
  3. Ludwig Reimer
    Pages 19-49
  4. Ludwig Reimer
    Pages 50-85
  5. Ludwig Reimer
    Pages 136-191
  6. Ludwig Reimer
    Pages 375-430
  7. Ludwig Reimer
    Pages 431-463
  8. Back Matter
    Pages 465-547

About this book

Introduction

The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.

Keywords

Electron Microscopes Electron and Ion Emission Materials Science crystal crystal structure damage diffraction electron electron diffraction electron microscope electron microscopy material materials science microscopy scattering spectroscopy transmission electron microscopy X-ray

Authors and affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms-Universität MünsterMünsterFed. Rep. of Germany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-662-21579-1
  • Copyright Information Springer-Verlag Berlin Heidelberg 1989
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-50499-3
  • Online ISBN 978-3-662-21579-1
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • Buy this book on publisher's site