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Transmission Electron Microscopy

Physics of Image Formation and Microanalysis

  • Book
  • © 1997

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Part of the book series: Springer Series in Optical Sciences (SSOS, volume 36)

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About this book

Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

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Keywords

Table of contents (11 chapters)

Authors and Affiliations

  • Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Münster, Germany

    Ludwig Reimer

Bibliographic Information

  • Book Title: Transmission Electron Microscopy

  • Book Subtitle: Physics of Image Formation and Microanalysis

  • Authors: Ludwig Reimer

  • Series Title: Springer Series in Optical Sciences

  • DOI: https://doi.org/10.1007/978-3-662-14824-2

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1997

  • eBook ISBN: 978-3-662-14824-2Published: 11 November 2013

  • Series ISSN: 0342-4111

  • Series E-ISSN: 1556-1534

  • Edition Number: 4

  • Number of Pages: XVI, 587

  • Number of Illustrations: 185 b/w illustrations

  • Topics: Measurement Science and Instrumentation, Cell Biology

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