High-Resolution Imaging and Spectrometry of Materials

  • Frank Ernst
  • Manfred Rühle

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 50)

Table of contents

  1. Front Matter
    Pages I-XIV
  2. F. Ernst, W. Sigle
    Pages 1-8
  3. H. Müller, H. Rose
    Pages 9-68
  4. P. Kohler-Redlich, J. Mayer
    Pages 119-187
  5. H. Rose
    Pages 189-270
  6. T. Al-Kassab, H. Wollenberger, G. Schmitz, R. Kirchheim
    Pages 271-320
  7. R. W. Cahn, G. Ertl, J. Heydenreich
    Pages 419-433
  8. Back Matter
    Pages 435-442

About this book

Introduction

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

Keywords

AFM STM Transmission advanced electron optics coherent electron techniques composite electron microscopy electron optics imaging microscopy optics scanning probe techniques spectroscopy surface analysis transmission electron microscopy

Editors and affiliations

  • Frank Ernst
    • 1
  • Manfred Rühle
    • 2
  1. 1.Department of Materials Science and EngineeringCase Western Reserve UniversityClevelandUSA
  2. 2.MPI für MaterialforschungStuttgartGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-662-07766-5
  • Copyright Information Springer-Verlag Berlin Heidelberg 2003
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-07525-4
  • Online ISBN 978-3-662-07766-5
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • About this book