Overview
- Basic standard book
- Important with respect to semiconductor structures
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 43)
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Table of contents (11 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Almost all semiconductor devices contain metal-semiconductor, insulator-semiconductor, insulator-metal and/or semiconductor-semiconductor interfaces; and their electronic properties determine the device characteristics. This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. Using the continuum of interface–induced gap states (IFIGS) as a unifying theme, Mönch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-function tails of electron states, which overlap a semiconductor band-gap exactly at the interface, so they originate from the quantum-mechanical tunnel effect. He shows that a more chemical view relates the IFIGS to the partial ionic character of the covalent interface-bonds and that the charge transfer across the interface may be modeled by generalizing Pauling’s electronegativity concept. The IFIGS-and-electronegativity theory is used to quantitatively explain the barrier heights and band offsets of well-characterized Schottky contacts and semiconductor heterostructures, respectively.
Reviews
From the reviews:
"This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. … The originality of Mönch is more in the fact that he uses the interface-induced gap stats (IFIGS) as the unifying concept of his book. … Altogether, the present book will be very helpful for theorists in the field of semiconductor interface science." (Michel Wautelet, Physicalia, Vol. 28 (4-6), 2006)
Authors and Affiliations
Bibliographic Information
Book Title: Electronic Properties of Semiconductor Interfaces
Authors: Winfried Mönch
Series Title: Springer Series in Surface Sciences
DOI: https://doi.org/10.1007/978-3-662-06945-5
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2004
Hardcover ISBN: 978-3-540-20215-8Published: 14 January 2004
Softcover ISBN: 978-3-642-05778-6Published: 01 December 2010
eBook ISBN: 978-3-662-06945-5Published: 17 April 2013
Series ISSN: 0931-5195
Series E-ISSN: 2198-4743
Edition Number: 1
Number of Pages: XI, 264
Topics: Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Characterization and Evaluation of Materials, Engineering, general, Electronics and Microelectronics, Instrumentation