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Crystal Structure Determination

  • Werner Massa

Table of contents

  1. Front Matter
    Pages I-XI
  2. Werner Massa
    Pages 1-1
  3. Werner Massa
    Pages 3-11
  4. Werner Massa
    Pages 13-25
  5. Werner Massa
    Pages 27-31
  6. Werner Massa
    Pages 33-40
  7. Werner Massa
    Pages 41-66
  8. Werner Massa
    Pages 67-92
  9. Werner Massa
    Pages 93-109
  10. Werner Massa
    Pages 111-125
  11. Werner Massa
    Pages 127-143
  12. Werner Massa
    Pages 145-159
  13. Werner Massa
    Pages 161-170
  14. Werner Massa
    Pages 171-176
  15. Werner Massa
    Pages 181-197
  16. Back Matter
    Pages 199-210

About this book

Introduction

To solve a crystal structure means to determine the precise spatial arrangements of all of the atoms in a chemical compound in the crystalline state. This knowledge gives a chemist access to a large range of information, including connectivity, conformation, and accurate bond lengths and angles. In addition, it implies the stoichiometry, the density, the symmetry and the three dimensional packing of the atoms in the solid. Since interatomic distances are in the region of100-300 pm or 1-3 A, 1 microscopy using visible light (wavelength Ä ca. 300-700 nm) is not applicable (Fig. l. l). In 1912, Max von Laue showed that crystals are based on a three dimensionallattice which scatters radiation with a wavelength in the vicinity of interatomic distances, i. e. X -rays with Ä = 50-300 pm. The process bywhich this radiation, without changing its wave­ length, is converted through interference by the lattice to a vast number of observable "reflections" with characteristic directions in space is called X-ray diffraction. The method by which the directions and the intensities of these reflections are measured, and the ordering of the atoms in the crystal deduced from them, is called X-ray struc­ ture analysis. The following chapter deals with the lattice properties of crystals, the starting point for the explanation of these interference phenomena. Interatomic distances Crystals . . . . . . . . . .

Keywords

X-ray analysis X-ray diffraction crystal crystallography powder diagram structure determination

Authors and affiliations

  • Werner Massa
    • 1
  1. 1.Department of ChemistryUniversity of MarburgMarburgGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-662-06431-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 2004
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-05841-7
  • Online ISBN 978-3-662-06431-3
  • Buy this book on publisher's site