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- current challenges in surface metrology with a single, new interferometric approach
- A novel metrology to enhance current high-precision surface manufacturing technologies
- This is an Open Access-book
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Bibliographic Information
Book Title: Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry
Authors: Christopher Taudt
DOI: https://doi.org/10.1007/978-3-658-35926-3
Publisher: Springer Vieweg Wiesbaden
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s) 2022
Softcover ISBN: 978-3-658-35925-6Published: 17 November 2021
eBook ISBN: 978-3-658-35926-3Published: 16 November 2021
Edition Number: 1
Number of Pages: XXIII, 163
Number of Illustrations: 65 illustrations in colour
Topics: Optics, Lasers, Photonics, Optical Devices, Measurement Science and Instrumentation