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Structural Analysis of Point Defects in Solids

An Introduction to Multiple Magnetic Resonance Spectroscopy

  • Johann-Martin Spaeth
  • Jürgen R. Niklas
  • Ralph H. Bartram

Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 43)

Table of contents

  1. Front Matter
    Pages I-XI
  2. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 1-10
  3. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 11-33
  4. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 35-76
  5. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 77-138
  6. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 139-168
  7. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 169-229
  8. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 231-279
  9. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 281-307
  10. Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 309-328
  11. Back Matter
    Pages 329-369

About this book

Introduction

Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.

Keywords

Absorption ENDOR Electron paramagnetic resonance NMR Pseudopotential Sorption crystal electron electronics point defects semiconductor spectroscopy structure

Authors and affiliations

  • Johann-Martin Spaeth
    • 1
  • Jürgen R. Niklas
    • 1
  • Ralph H. Bartram
    • 2
  1. 1.Fachbereich PhysikUniversität-GesamthochschulePaderbornFed. Rep. of Germany
  2. 2.Department of PhysicsUniversity of ConnecticutStorrsUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-84405-8
  • Copyright Information Springer-Verlag Berlin Heidelberg 1992
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-84407-2
  • Online ISBN 978-3-642-84405-8
  • Series Print ISSN 0171-1873
  • Buy this book on publisher's site