Secondary Ion Mass Spectrometry SIMS V

Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985

  • Alfred Benninghoven
  • Richard J. Colton
  • David S. Simons
  • Helmut W. Werner

Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 44)

Table of contents

  1. Front Matter
    Pages I-XXI
  2. Retrospective

  3. Fundamentals

    1. Front Matter
      Pages 17-17
    2. C. Plog, G. Roth, W. Gerhard, W. Kerfin
      Pages 29-31
    3. S. A. Schwarz
      Pages 38-40
    4. U. Södervall, H. Odelius, A. Lodding, G. Frohberg, K. H. Kraatz, H. Wever
      Pages 41-44
    5. M. M. Brudny, K. D. Klöppel
      Pages 48-50
    6. R. B. Freas, J. E. Campana
      Pages 51-53
    7. B. Schueler, R. Beavis, G. Bolbach, W. Ens, D. E. Main, K. G. Standing
      Pages 57-59
    8. J.-F. Hennequin, R.-L. Inglebert, P. Viaris de Lesegno
      Pages 60-62
  4. Symposium: Detection of Sputtered Neutrals

    1. Front Matter
      Pages 69-69
    2. H. Oechsner
      Pages 70-74

About these proceedings

Keywords

Atom Diffusion Sorption adsorption catalyst chemistry crystal hydrogen isotope mass spectrometry materials science metals microscopy spectrometry structure

Editors and affiliations

  • Alfred Benninghoven
    • 1
  • Richard J. Colton
    • 2
  • David S. Simons
    • 3
  • Helmut W. Werner
    • 4
  1. 1.Physikalisches InstitutUniversität MünsterMünsterFed. Rep. of Germany
  2. 2.Chemistry DivisionNaval Research LaboratoryUSA
  3. 3.Center for Analytical ChemistryNational Bureau of StandardsGaithersburgUSA
  4. 4.Philips Research LaboratoriesNL-EindhovenThe Netherlands

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-82724-2
  • Copyright Information Springer-Verlag Berlin Heidelberg 1986
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-82726-6
  • Online ISBN 978-3-642-82724-2
  • Series Print ISSN 0172-6218
  • About this book