Point Defects in Semiconductors II

Experimental Aspects

  • Jacques Bourgoin
  • Michel Lannoo

Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 35)

Table of contents

  1. Front Matter
    Pages I-XVI
  2. Jacques Bourgoin, Michel Lannoo
    Pages 1-5
  3. Jacques Bourgoin, Michel Lannoo
    Pages 6-51
  4. Jacques Bourgoin, Michel Lannoo
    Pages 52-87
  5. Jacques Bourgoin, Michel Lannoo
    Pages 88-121
  6. Jacques Bourgoin, Michel Lannoo
    Pages 122-153
  7. Jacques Bourgoin, Michel Lannoo
    Pages 154-204
  8. Jacques Bourgoin, Michel Lannoo
    Pages 205-217
  9. Jacques Bourgoin, Michel Lannoo
    Pages 218-246
  10. Jacques Bourgoin, Michel Lannoo
    Pages 247-270
  11. Back Matter
    Pages 271-301

About this book

Introduction

In introductory solid-state physics texts we are introduced to the concept of a perfect crystalline solid with every atom in its proper place. This is a convenient first step in developing the concept of electronic band struc­ ture, and from it deducing the general electronic and optical properties of crystalline solids. However, for the student who does not proceed further, such an idealization can be grossly misleading. A perfect crystal does not exist. There are always defects. It was recognized very early in the study of solids that these defects often have a profound effect on the real physical properties of a solid. As a result, a major part of scientific research in solid-state physics has,' from the early studies of "color centers" in alkali halides to the present vigorous investigations of deep levels in semiconductors, been devoted to the study of defects. We now know that in actual fact, most of the interest­ ing and important properties of solids-electrical, optical, mechanical- are determined not so much by the properties of the perfect crystal as by its im­ perfections.

Keywords

crystal semiconductor solid-state physics

Authors and affiliations

  • Jacques Bourgoin
    • 1
  • Michel Lannoo
    • 2
  1. 1.Groupe de Physique des Solides de l’Ecole Normale SupérieureUniversité de Paris VIIParis CedexFrance
  2. 2.Laboratoire d’Etude des Surfaces et Interfaces, Physique des SolidesInstitut Superieur d’Electronique du NordLille CédexFrance

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-81832-5
  • Copyright Information Springer-Verlag Berlin Heidelberg 1983
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-81834-9
  • Online ISBN 978-3-642-81832-5
  • Series Print ISSN 0171-1873
  • About this book