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Scanning Tunneling Microscopy II

Further Applications and Related Scanning Techniques

  • Roland Wiesendanger
  • Hans-Joachim Güntherodt

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 28)

Table of contents

  1. Front Matter
    Pages I-XIV
  2. R. Wiesendanger, H.-J. Güntherodt
    Pages 1-6
  3. H. Siegenthaler
    Pages 7-49
  4. R. Guckenberger, T. Hartmann, W. Wiegräbe, W. Baumeister
    Pages 51-98
  5. E. Meyer, H. Heinzelmann
    Pages 99-149
  6. P. Grütter, H. J. Mamin, D. Rugar
    Pages 151-207
  7. H. K. Wickramasinghe
    Pages 209-231
  8. Roland Wiesendanger, Hans-Joachim Güntherodt
    Pages 303-342
  9. Back Matter
    Pages 343-350

About this book

Introduction

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed.

Keywords

Nanotechnology Scanning probe microscopy Sensor Surface science chemistry design dynamics electronics environment influence modeling optics quality simulation spectroscopy

Editors and affiliations

  • Roland Wiesendanger
    • 1
  • Hans-Joachim Güntherodt
    • 2
  1. 1.Institute of Applied PhysicsUniversity of HamburgHamburgGermany
  2. 2.Department of PhysicsUniversity of BaselBaselSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-79366-0
  • Copyright Information Springer-Verlag Berlin Heidelberg 1995
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-58589-3
  • Online ISBN 978-3-642-79366-0
  • Series Print ISSN 0931-5195
  • Buy this book on publisher's site