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X-Ray Diffraction by Disordered Lamellar Structures

Theory and Applications to Microdivided Silicates and Carbons

  • Book
  • © 1990

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Table of contents (9 chapters)

Keywords

About this book

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Authors and Affiliations

  • Geological Institute, Academy of Sciences, Moscow, USSR

    Victor A. Drits

  • Laboratoire de Cristallographie (associé au CNRS), Université d’Orléans, Orléans Cedex, France

    Cyril Tchoubar

Bibliographic Information

  • Book Title: X-Ray Diffraction by Disordered Lamellar Structures

  • Book Subtitle: Theory and Applications to Microdivided Silicates and Carbons

  • Authors: Victor A. Drits, Cyril Tchoubar

  • DOI: https://doi.org/10.1007/978-3-642-74802-8

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1990

  • Softcover ISBN: 978-3-642-74804-2Published: 13 December 2011

  • eBook ISBN: 978-3-642-74802-8Published: 06 December 2012

  • Edition Number: 1

  • Number of Pages: XVII, 371

  • Topics: Mineralogy, Crystallography and Scattering Methods, Inorganic Chemistry

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