X-Ray Diffraction by Disordered Lamellar Structures

Theory and Applications to Microdivided Silicates and Carbons

  • Victor A. Drits
  • Cyril Tchoubar

Table of contents

About this book

Introduction

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Keywords

X-ray carbon classification crystal distribution electron mineral scattering water

Authors and affiliations

  • Victor A. Drits
    • 1
  • Cyril Tchoubar
    • 2
  1. 1.Geological InstituteAcademy of SciencesMoscowUSSR
  2. 2.Laboratoire de Cristallographie (associé au CNRS)Université d’OrléansOrléans CedexFrance

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-74802-8
  • Copyright Information Springer-Verlag Berlin Heidelberg 1990
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-74804-2
  • Online ISBN 978-3-642-74802-8
  • About this book