Picosecond Electronics and Optoelectronics II

1. Front Matter

   Pages I-XII

   PDF

2. Introduction

   1. Introduction

      • F. J. Leonberger, C. H. Lee, F. Capasso, H. Morkoc

      Pages 1-2

3. High-Speed Probing Techniques

   1. Front Matter

      Pages 3-3

      PDF

   2. A Non-contact Electro-optic Prober for High Speed Integrated Circuits

      • J. A. Valdmanis, S. S. Pei

      Pages 4-10

   3. Photoconductive Generation of Subpicosecond Electrical Pulses and Their Measurement Applications

      • D. Grischkowsky, C.-C. Chi, I. N. Duling III, W. J. Gallagher, N. H. Halas, J.-M. Halbout et al.

      Pages 11-17

   4. Picosecond Sampling of GaAs Integrated Circuits

      • K. J. Weingarten, M. J. W. Rodwell, D. M. Bloom

      Pages 18-24

   5. Electro-optic Sampling of High-Speed, InP-Based Integrated Circuits

      • J. M. Wiesenfeld, R. S. Tucker, A. Antreasyan, C. A. Burrus, A. J. Taylor

      Pages 25-28

   6. Electro-optic Sampling Analysis of Timing Patterns at Critical Internal Nodes in Gigabit GaAs Multiplexers/Demultiplexers

      • X.-C. Zhang, R. K. Jain, R. Hickling

      Pages 29-32

   7. A Technique for Wing Suppressed IR Sampling

      • J. Nees, S. Williamson

      Pages 33-35

   8. Picosecond Electrical Pulse for VLSI Electronics Characterization

      • J.-M. Halbout, P. G. May, M. B. Ketchen, H. Jackel, G. P. Li, C.-C. Chi et al.

      Pages 36-39

   9. Ultrafast Optics Applied to Modern Device Research

      • G. Mourou, K. Meyer, J. Whitaker, M. Pessot, R. Grondin, C. Caruso

      Pages 40-48

   10. An Optically Strobed Sample and Hold Circuit

       • C. McConaghy

       Pages 49-52

   11. Laser Pulsed E-Beam System for High Speed I.C. Testing

       • P. May, J.-M Halbout, G. Chiu

       Pages 53-55

   12. Photoemissive Testing of High-Speed Electrical Waveforms

       • A. M. Weiner, P. S. D. Lin, R. B. Marcus

       Pages 56-60

   13. High-Speed Optical Logic Using GaAs

       • H. M. Gibbs, N. Peyghambarian, Y. H. Lee, J. L. Jewell, A. Migus, A. Antonetti et al.

       Pages 61-63

   14. Comparison of Sampling Oscilloscopes with ∼35 ps Transition Durations

       • J. R. Andrews

       Pages 64-66

   15. Picosecond Optoelectronic Study of a Thin Film Transmission Line Structure

       • G. Arjavalingam, J.-M. Halbout, G. V. Kopcsay, M. B. Ketchen

       Pages 67-70

4. Transient Transport

   1. Front Matter

      Pages 71-71

      PDF

   2. Direct Subpicosecond Measurement of Carrier Mobility of Photoexcited Electrons in GaAs

      • M. C. Nuss, D. H. Auston

      Pages 72-78

   3. Nonstationary Transport in MODFETs and Heterojunction Devices

      • K. Hess

      Pages 79-81

Over the past five years, there has been an enormous increase in the inter­ est in and understanding of electronic and optoelectronic devices operating in the picosecond (multigigahertz) range. This has been fueled in a sig­ nificant way by the spectacular advances in picosecond laser technology, electro optic sampling, III-V devices, and wideband fiber optic systems. Partly to address these advances, a new conference jointly sponsored by the IEEE Lasers and Electrooptics Society (IEEE (LEOS)) and the Op­ tical Society of America (OSA) was founded and its first meeting held in March 1985. The purpose of this meeting was to bring together work­ ers in the areas of electronics and optoelectronics who share a common interest in the physics and technology of picosecond solid-state electronic and optoelectronic devices, their multigigahertz applications, and ultrafast measurement techniques. Emphasis was placed on the interdisciplinary as­ pects of these areas, since each area is covered by its own topical meeting. This meeting was quite successful and led to a second meeting, of which this volume forms the proceedings.

• electronics
• laser
• laser technology
• measurement techniques
• optics
• optoelectronic devices
• optoelectronics

• United Technologies Research Center, East Hartford, USA

  Frederick John Leonberger

• Dept. of Electrical Engineering, University of Maryland, College Park, USA

  Chi H. Lee

• AT&T Bell Laboratories, Murray Hill, USA

  Federico Capasso

• Dept. of Electrical Engineering, University of Illinois, Champaign Urbana, USA

  Hadis Morkoc

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