Semiconductor Interfaces

Formation and Properties

  • Guy Le Lay
  • Jacques Derrien
  • Nino Boccara
Conference proceedings

Part of the Springer Proceedings in Physics book series (SPPHY, volume 22)

Table of contents

  1. Front Matter
    Pages I-XI
  2. Introduction

  3. Experimental Study of the Formation of Semiconductor Interfaces

  4. Structural Characterization of the Interfaces

  5. Electronic Properties of Interfaces

    1. Front Matter
      Pages 161-161

About these proceedings

Introduction

The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom­ mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel­ oped, powerful techniques such as scanning tunneling microscopy, high reso­ lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.

Keywords

development diffraction electronic properties microscopy optical properties optoelectronic devices production semiconductor spectroscopy transistor

Editors and affiliations

  • Guy Le Lay
    • 1
  • Jacques Derrien
    • 2
  • Nino Boccara
    • 3
  1. 1.Campus de LuminyC.R.M.C.2, CNRSMarseille, Cedex 09France
  2. 2.L.E.P.E.S., CNRSGrenobleFrance
  3. 3.Centre de Physique ThéoriqueLes HouchesFrance

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-72967-6
  • Copyright Information Springer-Verlag Berlin Heidelberg 1987
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-72969-0
  • Online ISBN 978-3-642-72967-6
  • Series Print ISSN 0930-8989
  • Series Online ISSN 1867-4941
  • About this book