Editors:
- Provides introduction to selected theoretical and experimental aspects of particular current interest in this rapidly developing field
- Of interest to newcomers and established workers alike
Part of the book series: Advances in Materials Research (ADVSMATERIALS, volume 2)
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Table of contents (9 chapters)
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Front Matter
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Back Matter
About this book
Editors and Affiliations
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Institute of Materials Research, Tohoku University, Aoba-ku, Sendai, Japan
Toshio Sakurai, Yousuke Watanabe
Bibliographic Information
Book Title: Advances in Scanning Probe Microscopy
Editors: Toshio Sakurai, Yousuke Watanabe
Series Title: Advances in Materials Research
DOI: https://doi.org/10.1007/978-3-642-56949-4
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2000
Hardcover ISBN: 978-3-540-66718-6Published: 27 March 2000
Softcover ISBN: 978-3-642-63084-2Published: 14 October 2012
eBook ISBN: 978-3-642-56949-4Published: 06 December 2012
Series ISSN: 1435-1889
Edition Number: 1
Number of Pages: XIV, 343
Topics: Electronics and Microelectronics, Instrumentation, Science, Humanities and Social Sciences, multidisciplinary, Materials Science, general, Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Solid State Physics