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© 2013

Transmission Electron Microscopy and Diffractometry of Materials

Textbook

Part of the Graduate Texts in Physics book series (GTP)

Table of contents

  1. Front Matter
    Pages I-XX
  2. Brent Fultz, James Howe
    Pages 1-57
  3. Brent Fultz, James Howe
    Pages 59-115
  4. Brent Fultz, James Howe
    Pages 117-144
  5. Brent Fultz, James Howe
    Pages 145-180
  6. Brent Fultz, James Howe
    Pages 181-236
  7. Brent Fultz, James Howe
    Pages 237-288
  8. Brent Fultz, James Howe
    Pages 289-348
  9. Brent Fultz, James Howe
    Pages 349-427
  10. Brent Fultz, James Howe
    Pages 429-462
  11. Brent Fultz, James Howe
    Pages 463-520
  12. Brent Fultz, James Howe
    Pages 521-586
  13. Brent Fultz, James Howe
    Pages 587-615
  14. Brent Fultz, James Howe
    Pages 617-679
  15. Back Matter
    Pages 681-761

About this book

Introduction

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Keywords

Characterization of Materials Dark-Field and Bright-Field Imaging Diffraction and Imaging Diffraction from Crystals Imaging Lens Systems Neutron Scattering Small-Angle Scattering Theory of Electron Microscopy and X-Ray Diffraction Transmission Electron Microscopy X-Ray Diffractometry

Authors and affiliations

  1. 1.Dept. Engineering &, Materials SciencesCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Dept. Materials Science and EngineeringUniversity of VirginiaCharlottesvilleUSA

About the authors

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Bibliographic information

Reviews

``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.''
John Hutchison in Journal of Microscopy

``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron

``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University

``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’
Colin Humphreys, Cambridge University

``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’
Ronald Gronsky, University of California, Berkeley