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  • Book
  • © 2011

Optical Measurement of Surface Topography

Editors:

  • Presents a wealth of related information under one title

  • Forms a companion guide to forthcoming ISO standards

  • Allows people to make an informed choice when procuring instrumentation

  • Is useful to manufacturers who want to embrace the new techniques of surface structuring

Buying options

eBook USD 189.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-12012-1
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 249.99
Price excludes VAT (USA)
Hardcover Book USD 249.99
Price excludes VAT (USA)

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Table of contents (12 chapters)

  1. Front Matter

  2. Some Common Terms and Definitions

    • Richard Leach
    Pages 15-22
  3. Limitations of Optical 3D Sensors

    • Gerd Häusler, Svenja Ettl
    Pages 23-48
  4. Calibration of Optical Surface Topography Measuring Instruments

    • Richard Leach, Claudiu Giusca
    Pages 49-70
  5. Chromatic Confocal Microscopy

    • François Blateyron
    Pages 71-106
  6. Point Autofocus Instruments

    • Katsuhiro Miura, Atsuko Nose
    Pages 107-129
  7. Focus Variation Instruments

    • Franz Helmli
    Pages 131-166
  8. Phase Shifting Interferometry

    • Peter de Groot
    Pages 167-186
  9. Coherence Scanning Interferometry

    • Peter de Groot
    Pages 187-208
  10. Digital Holographic Microscopy

    • Tristan Colomb, Jonas Kühn
    Pages 209-235
  11. Imaging Confocal Microscopy

    • Roger Artigas
    Pages 237-286
  12. Light Scattering Methods

    • Theodore V. Vorburger, Richard Silver, Rainer Brodmann, Boris Brodmann, Jörg Seewig
    Pages 287-318
  13. Back Matter

About this book

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Keywords

  • Confocal microscopy
  • Instrument calibration
  • Scattering methods
  • Surface roughness
  • Topography characterization

Reviews

From the reviews:

“This book shows how optical microscopy can be used in the characterization and metrology of various surfaces. … Several important methods are presented in a clear and simple way … . The case studies scattered throughout the text greatly improve the readability and contribute to the practical emphasis of this book. … the index is comprehensive. I recommend this book to anyone trying to find the most appropriate method for surface topography measurement, as well as researchers who are new to using microscopy for measurements.”­­­ (Dejan Pantelić, Optics & Photonics News, December, 2011)

Editors and Affiliations

  • Industry & Innovation Div., National Physical Laboratory (NPL), Teddington, United Kingdom

    Richard Leach

About the editor

Professor Richard Leach works at National Physical Laboratory,Teddington, UK, since 1990. He is a visiting Professor of the Wolfson School for Mechanical and Manufacturing Engineering, Loughborough University. His current position is Principal Research Scientist in the Mass & Dimensional Group, Industry & Innovation Division. He is the lead scientist on three DIUS National Measurement System Engineering Measurement Programme projects: areal surface texture and structured surfaces metrology, development of low force transfer artefacts and probes for micro-coordinate measuring machines. He is also lead scientist on projects funded by DIUS Measurement for Innovators (MfI), EPSRC and EU. Professor Leach is the Measurement Service Manager for the Engineering Nanometrology Measurement Service at NPL.

Bibliographic Information

Buying options

eBook USD 189.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-12012-1
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 249.99
Price excludes VAT (USA)
Hardcover Book USD 249.99
Price excludes VAT (USA)