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  • Book
  • © 2010

Scanning Probe Microscopy in Nanoscience and Nanotechnology

Editors:

  • Scientific reviews on scanning tunneling microscopy and atomic force microscopy

  • Integrates basic scientific and applicational aspects

  • With a foreword by the co-inventor of AFM, Christoph Gerber

  • Useful reference to researchers and graduate students

Part of the book series: NanoScience and Technology (NANO)

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eBook USD 229.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-03535-7
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 299.99
Price excludes VAT (USA)
Hardcover Book USD 299.99
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Table of contents (26 chapters)

  1. Front Matter

    Pages i-xxx
  2. Scanning Probe Microscopy Techniques

    1. Front Matter

      Pages 1-1
    2. Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids

      • Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer, Boris Anczykowski
      Pages 3-21
    3. Polarization-Sensitive Tip-Enhanced Raman Scattering

      • Pietro Giuseppe Gucciardi, Marc Lamy de La Chapelle, Jean-Christophe Valmalette, Gennaro Picardi, Razvigor Ossikovski
      Pages 57-88
    4. Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics

      • Edward D. de Asis Jr., You Li, Alex J. Austin, Joseph Leung, Cattien V. Nguyen
      Pages 129-168
  3. Characterization

    1. Front Matter

      Pages 325-325
    2. Simultaneous Topography and Recognition Imaging

      • A. Ebner, L. A. Chtcheglova, J. Preiner, J. Tang, L. Wildling, H. J. Gruber et al.
      Pages 325-362
    3. Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM

      • Noël M. Ziebarth, Felix Rico, Vincent T. Moy
      Pages 363-393
    4. Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices

      • F. Consolo, F. Mastrangelo, G. Ciardelli, F. M. Montevecchi, U. Morbiducci, M. Sassi et al.
      Pages 425-486
    5. Quantized Mechanics of Nanotubes and Bundles

      • Nicola M. Pugno
      Pages 487-506
    6. Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials

      • Armen N. Kocharian, Gayanath W. Fernando, Chi Yang
      Pages 507-570
    7. Mechanical Properties of One-Dimensional Nanostructures

      • Gheorghe Stan, Robert F. Cook
      Pages 571-611

About this book

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and  typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber

Keywords

  • Industrie
  • Nanomaterial
  • Sensor
  • atomic force microscope
  • biomimetics
  • biosensor
  • carbon nanotubes
  • electronics
  • mechanics
  • modeling
  • nanoscience
  • nanostructure
  • nanotechnology
  • soft matter
  • surface

Editors and Affiliations

  • Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, Columbus, U.S.A.

    Bharat Bhushan

Bibliographic Information

Buying options

eBook USD 229.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-03535-7
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 299.99
Price excludes VAT (USA)
Hardcover Book USD 299.99
Price excludes VAT (USA)