Fringe 2009

6th International Workshop on Advanced Optical Metrology

  • Wolfgang Osten
  • Malgorzata Kujawinska

Table of contents

  1. Front Matter
    Pages i-xxii
  2. Key Note

    1. Front Matter
      Pages 1-1
  3. Topic 1

    1. Front Matter
      Pages 1-1
    2. O.V. Angelsky, C.Yu. Zenkova, N. V. Gorodyns’ka
      Pages 1-6
    3. Dinesh N. Naik, Takahiro Ezawa, Yoko Miyamoto, Mitsuo Takeda
      Pages 1-6
    4. Colin JR Sheppard, Shan S Kou, Shalin Mehta
      Pages 1-7
    5. P. F. Almoro, G. Pedrini, F. Zhang, A.M.S. Maallo, A. Anand, P. N. Gundu et al.
      Pages 1-6
    6. Julio C. Estrada, Fernando Mendoza-Santoyo, Manuel de la Torre, Tonatihu Saucedo
      Pages 1-9
    7. Yukihiro Ishii, Sayaka Idoi, Hayato Fujita, Hideki Funamizu
      Pages 1-6
    8. Claas Falldorf, Reiner Klattenhoff, Achim Gesierich, Christoph v. Kopylow, Ralf Bergmann
      Pages 1-6
    9. M. Kujawińska, N. Kumar, A. Michalkiewicz
      Pages 1-7
    10. J.A. Quiroga, J.A. Gómez-Pedrero, M. Servín
      Pages 1-6
    11. Joseph Rosen, Barak Katz
      Pages 1-5

About this book


The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields.

Topics of particular interest are:

  • New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering)
  • Application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility)
  • 4D Optical Metrology over a Large Scale Range (from Macro to Nano)
  • Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment)
  • New Optical Sensors and Measurement Systems for Industrial Inspection.

Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.


Scanning Speckle metrology Structured light techniques Time-of-Flight classic interferometry holographic interferometry, time-of-flight camera

Editors and affiliations

  • Wolfgang Osten
    • 1
  • Malgorzata Kujawinska
    • 2
  1. 1.Inst. Technische OptikUniversität StuttgartStuttgartGermany
  2. 2.Institute of Automatic Control & RoboticWarsaw University of TechnologyWarszawaPoland

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2009
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Engineering
  • Print ISBN 978-3-642-03050-5
  • Online ISBN 978-3-642-03051-2
  • About this book