Noncontact Atomic Force Microscopy

Volume 2

  • Seizo Morita
  • Franz J. Giessibl
  • Roland Wiesendanger

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages 1-17
  2. Seizo Morita
    Pages 1-13
  3. Masayuki Abe, Ken-ichi Morita
    Pages 15-30
  4. Oscar Custance, Noriaki Oyabu, Yoshiaki Sugimoto
    Pages 31-68
  5. André Schirmeisen, Hendrik Hölscher, Udo D. Schwarz
    Pages 95-119
  6. Franz J. Giessibl
    Pages 121-142
  7. Yoshiaki Sugimoto
    Pages 169-190
  8. Markus Ternes, Christopher P. Lutz, Andreas J. Heinrich
    Pages 191-215
  9. Sabine Hirth, Frank Ostendorf, Michael Reichling
    Pages 217-226
  10. T. Trevethan, N. Martsinovich, L. Kantorovich, A. L. Shluger
    Pages 251-273
  11. Alexander Schwarz, Uwe Kaiser, Rene Schmidt, Roland Wiesendanger
    Pages 275-286
  12. Cesar Lazo, Hendrik Hölscher, Vasile Caciuc, Stefan Heinze
    Pages 287-301
  13. Kei Kobayashi, Hirofumi Yamada
    Pages 303-328
  14. Takeshi Fukuma, Suzanne P. Jarvis
    Pages 329-345
  15. Hideki Kawakatsu, Shuhei Nishida, Dai Kobayashi, Kazuhisa Nakagawa, Shigeki Kawai
    Pages 347-360
  16. A. Raman, R. Reifenberger, J. Melcher, R. Tung
    Pages 361-395
  17. Back Matter
    Pages 1-5

About this book

Introduction

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Keywords

Atomic and molecular imaging Atomic scale magnetic imaging Chemical identification Force spectroscopy and mapping Tuning fork liquid microscopy modeling nanotechnology spectroscopy

Editors and affiliations

  • Seizo Morita
    • 1
  • Franz J. Giessibl
    • 2
  • Roland Wiesendanger
    • 3
  1. 1.Graduate School of Engineering, Dept. of Electrical, Electronic andOsaka UniversitySuitaJapan
  2. 2.Institut für Experimentelle und, Angewandte PhysikUniversität RegensburgRegensburgGermany
  3. 3.FB Physik, Inst. Angewandte PhysikUniversität HamburgHamburgGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-01495-6
  • Copyright Information Springer-Verlag Berlin Heidelberg 2009
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-642-01494-9
  • Online ISBN 978-3-642-01495-6
  • Series Print ISSN 1434-4904
  • About this book