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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

Volume 2: Materials Science

  • Silvia Richter
  • Alexander Schwedt

Table of contents

  1. Front Matter
    Pages I-XXXII
  2. Materials Science

  3. Materials for Information Technology

    1. Si-based semiconductors

      1. M. J. Hÿtch, F. Houdellier, F. Hüe, E. Snoeck
        Pages 5-6
      2. F. Andrieu, T. Ernst, O. Faynot, V. Delaye, D. Lafond, S. Deleonibus
        Pages 7-8
      3. D. Cooper, R. Truche, L. Clement, S. Pokrant, A. Chabli
        Pages 9-10
      4. P. Donnadieu, V. Chamard, M. Maret, J. P. Simon, P. Mur
        Pages 11-12
      5. H. J. Engelmann, H. Geisler, R. Huebner, P. Potapov, D. Utess, E. Zschech
        Pages 13-14
      6. P. Favia, D. Klenov, G. Eneman, P. Verheyen, M. Bauer, D. Weeks et al.
        Pages 15-16
      7. H. -J. Fitting, Roushdey Salh, L. Kourkoutis, B. Schmidt
        Pages 17-18
      8. M. MacKenzie, A. J. Craven, D. W. McComb, C. M. McGilvery, S. McFadzean, S. De Gendt
        Pages 23-24
      9. K. Masenelli-Varlot, S. Luca, G. Thollet, P. H. Jouneau, D. Mariolle
        Pages 25-26
      10. S. B. Mi, C. L. Jia, K. Urban, Q. T. Zhao, S. Mantl
        Pages 27-28
      11. U. Muehle, M. Krause, F. Goetze, D. Wolf, U. Gaebler
        Pages 29-30
      12. R. Pantel, J. L Rouvière, E. Gautier, S. Denorme, C. Fenouiller-Beranger, F. Boeuf et al.
        Pages 33-34
      13. O. Richard, P. Van Marcke, H. Bender
        Pages 35-36
      14. G. Servanton, R. Pantel, M. Juhel, F. Bertin
        Pages 37-38
    2. Compound semiconductors

      1. C. Kisielowski, R. Erni, J. Meyer
        Pages 39-40
      2. C. J. Humphreys, M. J. Galtrey, R. A. Oliver, M. J. Kappers, D. Zhu, C. McAleese et al.
        Pages 41-42
      3. T. B. Adams, I. Nemeth, G. Lukin, B. Kunert, W. Stolz, K. Volz
        Pages 43-44
      4. A. M. Beltrán, T. Ben, A. M. Sánchez, D. L. Sales, M. F. Chisholm, M. Varela et al.
        Pages 45-46
      5. D. Cherns, L. Meshi, I. Griffiths, S. Khongphetsak, S. V. Novikov, N. Farley et al.
        Pages 47-48
      6. P. D. Cherns, C. McAleese, M. J. Kappers, C. J. Humphreys
        Pages 49-50
      7. M. Cheynet, S. Pokrant, M. Aimadeddine, V. Arnal, F. Volpi
        Pages 51-52
      8. J. Smalc-Koziorowska, G. P. Dimitrakopulos, Ph. Komninou, Th. Kehagias, S. -L. Sahonta, G. Tsiakatouras et al.
        Pages 53-54
      9. S. -L. Sahonta, A. Adikimenakis, G. P. Dimitrakopulos, Ph. Komninou, H. Kirmse, E. Pavlidou et al.
        Pages 55-56
      10. N. Frangis, M. Marinova, I. Tsiaoussis, E. K. Polychroniadis, T. Robert, S. Juillaguet et al.
        Pages 57-58
      11. T. Isshiki, K. Nishio, Y. Abe, J. Komiyama, S. Suzuki, H. Nakanishi
        Pages 59-60
      12. A. Łaszcz, J. Ratajczak, A. Czerwinski, K. Kosiel, J. Kubacka-Traczyk, J. Muszalski et al.
        Pages 61-62
      13. O. I. Lebedev, A. V. Olenev, G. Van Tendeloo
        Pages 63-64
      14. D. Litvinov, H. Blank, R. Schneider, D. Gerthsen, M. Hetterich
        Pages 65-66
      15. J. G. Lozano, M. Herrera, R. García, N. D. Browning, S. Ruffenach, O. Briot et al.
        Pages 69-70
      16. P. Manolaki, I. Häusler, H. Kirmse, W. Neumann, P. Vennéguès, P. De Mierry et al.
        Pages 71-72
      17. A. Mogilatenko, W. Neumann, T. Wernicke, E. Richter, M. Weyers, B. Velickov et al.
        Pages 73-74
      18. F. M. Morales, A. Aouni, R. García, P. A. Postigo, C. G. Fonstad, S. I. Molina
        Pages 75-76
      19. F. M. Morales, J. G. Lozano, R. García, V. Lebedev, S. Hauguth-Frank, V. Cimalla et al.
        Pages 77-78
      20. A. Mouti, S. Hasanovic, M. Cantoni, E. Feltin, N. Grandjean, P. Stadelmann
        Pages 79-80
      21. A. Pretorius, A. Rosenauer, T. Aschenbrenner, H. Dartsch, S. Figge, D. Hommel
        Pages 81-82
      22. T. Remmele, M. Albrecht, I. Häusler, L. Geelhaar, H. Riechert, H. Abu-Farsakh et al.
        Pages 83-84
      23. J. L. Rouviere, C. Bougerol, J. Coraux, B. Amstatt, E. Bellet-Amalric, B. Daudin
        Pages 85-86
      24. S. Mansouri, I. Monnet, H. Lebius, G. Nouet, P. Ruterana
        Pages 87-88
      25. D. L. Sales, J. C. Hernandez, P. A. Midgley, A. M. Beltran, A. M. Sanchez, T. Ben et al.
        Pages 91-92
      26. H. Schuhmann, C. Denker, T. Niermann, J. Malindretos, A. Rizzi, M. Seibt
        Pages 93-94
      27. M. Soda, U. Wurstbauer, M. Hirmer, W. Wegscheider, J. Zweck
        Pages 95-96

About these proceedings

Introduction

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.

Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.

The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

Keywords

electron electron microscopy microscopy nanomaterial polymer

Editors and affiliations

  • Silvia Richter
    • 1
  • Alexander Schwedt
    • 1
  1. 1.Central Facility for Electron MicroscopyRWTH AachenAachenGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-540-85226-1
  • Copyright Information Springer-Verlag Berlin Heidelberg 2008
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-540-85225-4
  • Online ISBN 978-3-540-85226-1
  • Buy this book on publisher's site