EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

Volume 2: Materials Science

  • Silvia Richter
  • Alexander Schwedt

Table of contents

  1. Front Matter
    Pages I-XXXII
  2. Materials Science

  3. Materials for Information Technology

    1. Si-based semiconductors

      1. M. J. Hÿtch, F. Houdellier, F. Hüe, E. Snoeck
        Pages 5-6
      2. F. Andrieu, T. Ernst, O. Faynot, V. Delaye, D. Lafond, S. Deleonibus
        Pages 7-8
      3. D. Cooper, R. Truche, L. Clement, S. Pokrant, A. Chabli
        Pages 9-10
      4. P. Donnadieu, V. Chamard, M. Maret, J. P. Simon, P. Mur
        Pages 11-12
      5. H. J. Engelmann, H. Geisler, R. Huebner, P. Potapov, D. Utess, E. Zschech
        Pages 13-14
      6. P. Favia, D. Klenov, G. Eneman, P. Verheyen, M. Bauer, D. Weeks et al.
        Pages 15-16
      7. H. -J. Fitting, Roushdey Salh, L. Kourkoutis, B. Schmidt
        Pages 17-18
      8. M. MacKenzie, A. J. Craven, D. W. McComb, C. M. McGilvery, S. McFadzean, S. De Gendt
        Pages 23-24
      9. K. Masenelli-Varlot, S. Luca, G. Thollet, P. H. Jouneau, D. Mariolle
        Pages 25-26
      10. S. B. Mi, C. L. Jia, K. Urban, Q. T. Zhao, S. Mantl
        Pages 27-28
      11. U. Muehle, M. Krause, F. Goetze, D. Wolf, U. Gaebler
        Pages 29-30
      12. R. Pantel, J. L Rouvière, E. Gautier, S. Denorme, C. Fenouiller-Beranger, F. Boeuf et al.
        Pages 33-34
      13. O. Richard, P. Van Marcke, H. Bender
        Pages 35-36
      14. G. Servanton, R. Pantel, M. Juhel, F. Bertin
        Pages 37-38

About these proceedings


Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.

Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.

The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.


electron electron microscopy microscopy nanomaterial polymer

Editors and affiliations

  • Silvia Richter
    • 1
  • Alexander Schwedt
    • 1
  1. 1.Central Facility for Electron MicroscopyRWTH AachenAachenGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-540-85226-1
  • Copyright Information Springer-Verlag Berlin Heidelberg 2008
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-540-85225-4
  • Online ISBN 978-3-540-85226-1
  • About this book