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EMC 2008

Vol 1: Instrumentation and Methods

  • Conference proceedings
  • © 2008


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Table of contents (417 papers)

  1. Instrumentation and Methods

  2. TEM and STEM instrumentation and Electron Optics

    1. Aberration Correctors


About this book

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

Editors and Affiliations

  • Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State Research, Research Centre Jülich, Jülich, Germany

    Martina Luysberg, Karsten Tillmann

  • Central Facility for Electron Microscopy, RWTH Aachen, Aachen, Germany

    Thomas Weirich

Bibliographic Information

  • Book Title: EMC 2008

  • Book Subtitle: Vol 1: Instrumentation and Methods

  • Editors: Martina Luysberg, Karsten Tillmann, Thomas Weirich

  • DOI:

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)

  • Copyright Information: Springer-Verlag Berlin Heidelberg 2008

  • Hardcover ISBN: 978-3-540-85154-7Published: 26 August 2008

  • Softcover ISBN: 978-3-662-50225-9Published: 23 August 2016

  • eBook ISBN: 978-3-540-85156-1Published: 29 August 2008

  • Edition Number: 1

  • Number of Pages: XXXVIII, 862

  • Topics: Physics, general

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