Overview
- Editors:
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Bharat Bhushan
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA
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Masahiko Tomitori
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Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan
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Harald Fuchs
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Institute of Physics, FB 16, University of Münster, Münster, Germany
- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
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Table of contents (13 chapters)
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- Bharat Bhushan, Robert A. Sayer
Pages 1-61
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- Filippo Giannazzo, Patrick Fiorenza, Vito Raineri
Pages 63-103
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- Toshi Kasai, Bharat Bhushan
Pages 131-151
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- Joachim Loos, Alexander Alexeev
Pages 183-215
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- Mario D’Acunto, Paolo Giusti, Franco Maria Montevecchi, Gianluca Ciardelli
Pages 257-283
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- Tatsuo Ushiki, Kazushige Kawabata
Pages 285-308
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- Tianming Bao, David Fong, Sean Hand
Pages 359-412
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Back Matter
Pages 413-427
About this book
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.
Editors and Affiliations
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA
Bharat Bhushan
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Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan
Masahiko Tomitori
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Institute of Physics, FB 16, University of Münster, Münster, Germany
Harald Fuchs