Sensing with Terahertz Radiation

  • DanielĀ Mittleman

Part of the Springer Series in Optical Sciences book series (SSOS, volume 85)

Table of contents

  1. Front Matter
    Pages I-XVI
  2. Daniel R. Grischkowsky, Daniel Mittleman
    Pages 1-38
  3. Frank C. De Lucia
    Pages 39-115
  4. Daniel Mittleman
    Pages 117-153
  5. Zhiping Jiang, Xi-Cheng Zhang
    Pages 155-192
  6. Sean M. Duffy, Simon Verghese, K. Alex McIntosh
    Pages 193-236
  7. R. Alan Cheville, Matthew T. Reiten, Roger McGowan, Daniel R. Grischkowsky
    Pages 237-293
  8. Martin Koch
    Pages 295-316
  9. Back Matter
    Pages 335-339

About this book

Introduction

Sensing with Terahertz Radiation reviews the state of the art in the generation, manipulation, and detection of electromagnetic radiation in the terahertz range. Recent years have seen a tremendous growth in research and development efforts in this spectral regime, spanning roughly from 0.3 THz to 10 THz. This has been spurred in part by several startling advances, involving non-linear optical materials, ultrafast optical and electronic techniques, and spectroscopic methods. As a result, there have been qualitative and significant improvements in the generation and detection of THz radiation. These have enabled a number of "real world" applications of THz technologies, in a manner which would not have been practical only a few years ago. A number of demonstrations and feasibility tests are discussed, which serve as compelling evidence of the utility of such techniques. Owing to the unique characteristics of THz radiation and its interactions with materials, these methods can have substantial advantages over other more conventional technologies. This text includes contributions on topics including time-domain spectroscopy based on both photoconductive and electro-optic sampling, photomixing, and all-electronic THz generation. advantages over other, competing technologies in a number of different areas.

Keywords

Terahertz far-infrared imaging sensing spectroscopy sub-millimeter waves

Editors and affiliations

  • DanielĀ Mittleman
    • 1
  1. 1.Electrical and Computer Engineering Department MS-366Rice UniversityHoustonUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-540-45601-8
  • Copyright Information Springer-Verlag Berlin Heidelberg 2003
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-07717-3
  • Online ISBN 978-3-540-45601-8
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • About this book