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X-Ray Microscopy

Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983

  • Günter Schmahl
  • Dietbert Rudolph

Part of the Springer Series in Optical Sciences book series (SSOS, volume 43)

Table of contents

  1. Front Matter
    Pages I-IX
  2. Introduction

    1. G. Schmahl, D. Rudolph
      Pages 1-2
  3. X-Ray Sources

  4. X-Ray Optics

    1. Front Matter
      Pages 39-39
    2. R. O. Tatchyn
      Pages 40-50
    3. H. I. Smith, E. H. Anderson, A. M. Hawryluk, M. L. Schattenburg
      Pages 51-62
    4. G. Schmahl, D. Rudolph, P. Guttmann, O. Christ
      Pages 63-74
    5. N. M. Ceglio
      Pages 97-108
    6. A. G. Michette, M. T. Browne, P. Charalambous, R. E. Burge, M. J. Simpson, P. J. Duke
      Pages 109-118
    7. A. Franks, B. Gale
      Pages 129-138
    8. T. W. Barbee Jr.
      Pages 144-162
    9. W. K. Warburton, Z. U. Rek, T. W. Barbee Jr.
      Pages 163-170
  5. X-Ray Detectors

    1. Front Matter
      Pages 171-171
    2. P. Burstein, J. M. Davis
      Pages 184-189
  6. X-Ray Microscopes

    1. Front Matter
      Pages 191-191
    2. D. Rudolph, B. Niemann, G. Schmahl, O. Christ
      Pages 192-202
    3. H. Rarback, J. M. Kenney, J. Kirz, M. R. Howells, P. Chang, P. J. Coane et al.
      Pages 203-216
    4. B. Niemann
      Pages 217-225
    5. R. J. Rosser
      Pages 242-250
    6. F. Polack, S. Lowenthal
      Pages 251-260
  7. Applications of X-Ray Microscopy

    1. Front Matter
      Pages 261-261
    2. J. Kirz, D. Sayre
      Pages 262-267
    3. B. J. Panessa-Warren
      Pages 268-278
    4. R. Feder, V. Mayne-Banton, D. Sayre, J. Costa, B. K. Kim, M. G. Baldini et al.
      Pages 279-284
    5. P. C. Cheng, H. B. Peng, K. H. Tan, J. Wm. McGowan, R. Feder, D. M. Shinozaki
      Pages 285-293
    6. F. Pfannkuch, D. Hoder, H. Baumgärtel
      Pages 300-303
    7. D. Sayre, R. P. Haelbich, J. Kirz, W. B. Yun
      Pages 314-316
  8. X-Ray Holography

    1. Front Matter
      Pages 317-317
    2. E. S. Gluskin, G. N. Kulipanow, G. Ya. Kezerashvili, V. F. Pindyurin, A. N. Skrinsky, A. S. Sokolov et al.
      Pages 336-343
  9. Back Matter
    Pages 345-351

About these proceedings

Keywords

Röntgenstrahlmikroskopie X-ray electron microscopy microscopy optics synchrotron radiation

Editors and affiliations

  • Günter Schmahl
    • 1
  • Dietbert Rudolph
    • 1
  1. 1.Forschungsgruppe RöntgenmikroskopieUniversität GöttingenGöttingenFed. Rep. of Germany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-540-38833-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 1984
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-13547-1
  • Online ISBN 978-3-540-38833-3
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • Buy this book on publisher's site