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Table of contents

  1. Front Matter
    Pages i-xx
  2. Hiroyuki Fujiwara
    Pages 1-16
  3. Fundamental Principles of Ellipsometry

    1. Front Matter
      Pages 17-17
    2. Robert W. Collins
      Pages 19-58
    3. James N. Hilfiker, Jianing Sun, Nina Hong
      Pages 59-88
    4. Maria Isabel Alonso, Miquel Garriga
      Pages 89-113
    5. James N. Hilfiker, Tom Tiwald
      Pages 115-153
    6. Hiroyuki Fujiwara
      Pages 155-172
  4. Characterization of Materials and Structures

    1. Front Matter
      Pages 173-173
    2. Zhiquan Huang, Lila R. Dahal, Prakash Koirala, Wenhui Du, Simon Cao, Xunming Deng et al.
      Pages 175-200
    3. Gerald E. Jellison Jr., Pooran C. Joshi
      Pages 201-225
    4. Hiroyuki Fujiwara
      Pages 227-252
    5. Hiroyuki Fujiwara
      Pages 253-280
    6. Abdel-Rahman A. Ibdah, Puruswottam Aryal, Puja Pradhan, Sylvain Marsillac, Nikolas J. Podraza, Robert W. Collins
      Pages 281-331
    7. Sukgeun Choi
      Pages 333-355
    8. Prakash Koirala, Jian Li, Nikolas J. Podraza, Robert W. Collins
      Pages 357-413
    9. Nikolas J. Podraza
      Pages 415-438
    10. Maria Isabel Alonso, Mariano Campoy-Quiles
      Pages 439-461
    11. Hiroyuki Fujiwara, Nikolas J. Podraza, Maria Isabel Alonso, Masato Kato, Kiran Ghimire, Tetsuhiko Miyadera et al.
      Pages 463-507
    12. Hiroyuki Fujiwara, Shohei Fujimoto
      Pages 523-563
  5. Back Matter
    Pages 587-594

About this book

Introduction

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.


Keywords

Amorphous Si solar cells CIGS growth ananlysis Compound solar cells Hybrid perovskites Microcrystalline Si solar cells Nanomaterial-based solar cells Optical analysis of solar cells Optical constants of solar materials Organic solar cells Si heterojunction solar cells Spectroscopic ellipsometry

Editors and affiliations

  • Hiroyuki Fujiwara
    • 1
  • Robert W. Collins
    • 2
  1. 1.Department of Electrical, Electronic and Computer EngineeringGifu UniversityGifuJapan
  2. 2.Department of Physics and AstronomyThe University of ToledoToledoUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-75377-5
  • Copyright Information Springer International Publishing AG, part of Springer Nature 2018
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-75375-1
  • Online ISBN 978-3-319-75377-5
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • Buy this book on publisher's site