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Advanced Solutions in Diagnostics and Fault Tolerant Control

  • Jan M. Kościelny
  • Michał Syfert
  • Anna Sztyber
Conference proceedings DPS 2017

Part of the Advances in Intelligent Systems and Computing book series (AISC, volume 635)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Diagnostic and Intelligent Control Systems

    1. Front Matter
      Pages 1-1
    2. Marcin Pazera, Kamil Klimkowicz, Beata Wrzesińska, Marcin Witczak
      Pages 33-44
    3. Dušan Krokavec, Anna Filasová
      Pages 57-69
    4. Mariusz Buciakowski, Marcin Pazera, Marcin Witczak
      Pages 82-93
    5. Michał Syfert, Jan Maciej Kościelny, Michał Bartyś
      Pages 143-154
  3. Advanced Signal Processing, Computing, and System Identification

    1. Front Matter
      Pages 155-155
    2. Krzysztof Jaroś, Anna Witkowska, Roman Śmierzchalski
      Pages 157-168
    3. Zdzisław Kowalczuk, Tomasz Białaszewski
      Pages 203-214
    4. Zdzisław Kowalczuk, Marek Tatara, Tomasz Stefański
      Pages 241-252
    5. Zdzisław Kowalczuk, Mateusz Świergal, Mirosław Wróblewski
      Pages 253-266
  4. Applications of Diagnostic Methods

    1. Front Matter
      Pages 267-267
    2. Robert Sitnik, Jakub Michoński, Wojciech Glinkowski
      Pages 269-280
    3. Wiesław Wajs, Marcin Ochab, Piotr Wais, Kamil Trojnar, Hubert Wojtowicz
      Pages 281-290
    4. Michał Żejmo, Marek Kowal, Józef Korbicz, Roman Monczak
      Pages 316-327
    5. Anna Sztyber, Brian Brisco, Terry Pultz, Marek Zaremba
      Pages 336-346
    6. Piotr Lipnicki, Daniel Lewandowski, Michał Kaczmarek, Andrea Cortinovis, Diego Pareschi
      Pages 347-356
    7. Yuqi Wang, Jean-Philippe Cassar, Vincent Cocquempot, Anne-Sophie Guilbert
      Pages 368-379
    8. Walid Mechri, Hai-Canh Vu, Phuc Do, Timothee Klingelschmidt, Flavien Peysson, Didier Theilliol
      Pages 380-389
    9. Igor Korobiichuk, Ruslan Hryshchuk, Victor Mamarev, Volodymyr Okhrimchuk, Maciej Kachniarz
      Pages 402-411
    10. Michał Szczepanik, Ireneusz Jóźwiak
      Pages 412-419
    11. Jan Maciej Kościelny, Michał Syfert, Paweł Wnuk
      Pages 449-457
  5. Back Matter
    Pages 471-472

About these proceedings

Introduction

This book highlights the latest achievements concerning the theory, methods and practice of fault diagnostics, fault tolerant systems and cyber safety. When considering the diagnostics of industrial processes and systems, increasingly important safety issues cannot be ignored. In this context, diagnostics plays a crucial role as a primary measure of the improvement of the overall system safety integrity level. Obtaining the desired diagnostic coverage or providing an appropriate level of inviolability of the integrity of a system is now practically inconceivable without the use of fault detection and isolation methods.

Given the breadth and depth of its coverage, the book will be of interest to researchers faced with the challenge of designing technical and medical diagnosis systems, as well as junior researchers and students in the fields of automatic control, robotics, computer science and artificial intelligence.


Keywords

Diagnostics of Processes and Systems Fault Modeling and Simulation Fault Detection, Isolation and Identification Fault Tolerant Control Systems Industrial Applications

Editors and affiliations

  • Jan M. Kościelny
    • 1
  • Michał Syfert
    • 2
  • Anna Sztyber
    • 3
  1. 1.Faculty of Mechatronics, Institute of Automatic Control and RoboticsWarsaw University of TechnologyWarsawPoland
  2. 2.Faculty of Mechatronics, Institute of Automatic Control and RoboticsWarsaw University of TechnologyWarsawPoland
  3. 3.Faculty of Mechatronics, Institute of Automatic Control and RoboticsWarsaw University of TechnologyWarsawPoland

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-64474-5
  • Copyright Information Springer International Publishing AG 2018
  • Publisher Name Springer, Cham
  • eBook Packages Engineering
  • Print ISBN 978-3-319-64473-8
  • Online ISBN 978-3-319-64474-5
  • Series Print ISSN 2194-5357
  • Series Online ISSN 2194-5365
  • Buy this book on publisher's site