Overview
- Provides a succinct but comprehensive reference covering common diagnostic dilemmas
- Clearly illustrates key features through extensive color photos and illustrations
- Written by experts in the field
Part of the book series: Essentials in Cytopathology (EICP, volume 27)
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Keywords
Table of contents (13 chapters)
Authors and Affiliations
About the authors
Assistant Professor
Department of Pathology
University of New Mexico School of Medicine
Interests:
Cytopathology
Surgical Pathology
Gastrointestinal Pathology
Education and Certification Information
Fellowship:
Fellowship in Cytopathology, Beth Israel Deaconess Medical Center, Boston, MA, 2010-2011
Residency:
Residency in Pathology, Beth Israel Deaconess Medical Center, Boston, MA, 2006-2010
Medical School:
M.D., University of Florida College of Medicine, Gainesville, FL, 2001-2005
Doctorate:
Ph.D., Pharmacology, University of Florida College of Medicine, Gainesville, FL, 1997-2001
Board Certifications:
American Board of Pathology certification inAnatomical Pathology, 2012
Specialties:
Cytopathology, Surgical Pathology
Bibliographic Information
Book Title: Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features
Authors: Von G. Samedi, Thèrése Bocklage
Series Title: Essentials in Cytopathology
DOI: https://doi.org/10.1007/978-3-319-39809-9
Publisher: Springer Cham
eBook Packages: Medicine, Medicine (R0)
Copyright Information: Springer International Publishing Switzerland 2016
Softcover ISBN: 978-3-319-39807-5Published: 17 November 2016
eBook ISBN: 978-3-319-39809-9Published: 22 September 2016
Series ISSN: 1574-9053
Series E-ISSN: 1574-9061
Edition Number: 1
Number of Pages: XVII, 253
Number of Illustrations: 1 b/w illustrations, 469 illustrations in colour
Topics: Pathology