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Building Secure Defenses Against Code-Reuse Attacks

  • Lucas Davi
  • Ahmad-Reza Sadeghi

Part of the SpringerBriefs in Computer Science book series (BRIEFSCOMPUTER)

Table of contents

  1. Front Matter
    Pages i-x
  2. Lucas Davi, Ahmad-Reza Sadeghi
    Pages 1-6
  3. Lucas Davi, Ahmad-Reza Sadeghi
    Pages 7-25
  4. Lucas Davi, Ahmad-Reza Sadeghi
    Pages 27-54
  5. Lucas Davi, Ahmad-Reza Sadeghi
    Pages 55-67
  6. Lucas Davi, Ahmad-Reza Sadeghi
    Pages 69-74

About this book

Introduction

This book provides an in-depth look at return-oriented programming attacks. It explores several conventional return-oriented programming attacks and analyzes the effectiveness of defense techniques including address space layout randomization (ASLR) and the control-flow restrictions implemented in security watchdogs such as Microsoft EMET.

Chapters also explain the principle of control-flow integrity (CFI), highlight the benefits of CFI and discuss its current weaknesses. Several improved and sophisticated return-oriented programming attack techniques such as just-in-time return-oriented programming are presented.

Building Secure Defenses against Code-Reuse Attacks is an excellent reference tool for researchers, programmers and professionals working in the security field. It provides advanced-level students studying computer science with a comprehensive overview and clear understanding of important runtime attacks.

Keywords

Buffer overflow Code injection attacks Return-oriented programming Runtime attack model Runtime attacks Code randomization Control-flow integrity

Authors and affiliations

  • Lucas Davi
    • 1
  • Ahmad-Reza Sadeghi
    • 2
  1. 1.CASEDTechnische Universität DarmstadtDarmstadtGermany
  2. 2.CASEDTechnische Universität DarmstadtDarmstadtGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-25546-0
  • Copyright Information The Author(s) 2015
  • Publisher Name Springer, Cham
  • eBook Packages Computer Science
  • Print ISBN 978-3-319-25544-6
  • Online ISBN 978-3-319-25546-0
  • Series Print ISSN 2191-5768
  • Series Online ISSN 2191-5776
  • Buy this book on publisher's site