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  • © 2021

Scanning Probe Microscopy

The Lab on a Tip

  • Explains all essential aspects of scanning probe microscopy, including STM and AFM techniques

  • Serves as an ideal accompaniment to courses at the graduate and advanced undergraduate levels

  • Presents state-of-the-art scientific results based on the latest research

  • Covers a range of other SPM techniques

Part of the book series: Graduate Texts in Physics (GTP)

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eBook USD 54.99
Price excludes VAT (USA)
  • ISBN: 978-3-030-37089-3
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 69.99
Price excludes VAT (USA)
Hardcover Book USD 89.99
Price excludes VAT (USA)

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xiv
  2. Introduction to Scanning Probe Microscopy

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 1-12
  3. Introduction to Scanning Tunneling Microscopy

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 13-45
  4. Force Microscopy

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 47-107
  5. Magnetic Force Microscopy

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 109-211
  6. Other Members of the SPM Family

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 213-241
  7. Artifacts in SPM

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 243-261
  8. Future Aspects of SPM

    • Ernst Meyer, Roland Bennewitz, Hans J. Hug
    Pages 263-271
  9. Back Matter

    Pages 273-322

About this book

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience.

This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering.

The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.

Keywords

  • Scanning Tunneling Microscopy
  • Atomic Force Microscopy
  • Magnetic Force Microscopy
  • Friction Force Microscopy
  • Introduction to STM techniques
  • Contact Force Microscopy
  • Tapping Mode Force Microscopy
  • High-speed imaging of biological matter

Authors and Affiliations

  • Department of Physics, University of Basel, Basel, Switzerland

    Ernst Meyer

  • Leibniz Institute for New Materials gGmbH, INM, Saarbrücken, Germany

    Roland Bennewitz

  • Empa, Dübendorf, Switzerland

    Hans J. Hug

About the authors

Ernst Meyer is Professor of Physics at the University of Basel and an expert in the field of atomic force microscopy. He has chaired European programmes for the study of nanotribology and is member of the executive board of the Swiss Nanoscience Institute. His research focuses on scientific questions in the fields of nanomechanics and nanoelectronics. 

Roland Bennewitz is Professor of Physics at Saarland University and group leader at the Leibniz Institute for New Materials (INM) in Saarbrücken, Germany. His main areas of expertise are high-resolution friction force microscopy, force microscopy of liquid-solid interfaces, and control of adhesion and friction by macromolecular functionalization or ionic liquids. He has chaired international conferences such are the Gordon Research Conference in Tribology 2014 and a Beilstein Symposium on Molecular Mechanisms in Tribology in 2016. He currently serves as on the Editorial Board of the Journal Tribology Letters. 

Hans Josef Hug is Professor of Physics at the University of Basel and laboratory head at the Empa - Swiss Federal Laboratories for Materials Testing and Research in Dübendorf, near Zürich, where he leads the laboratory for Magnetic and Functional Thin Films. In 2003 he and his team received the Swiss Technology Award for the development of high resolution and quantitative magnetic force microscopy. His main areas of expertise are magnetism and magnetic thin film systems and scanning force microscopy with a particular emphasis on magnetic force microscopy.

Bibliographic Information

Buying options

eBook USD 54.99
Price excludes VAT (USA)
  • ISBN: 978-3-030-37089-3
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 69.99
Price excludes VAT (USA)
Hardcover Book USD 89.99
Price excludes VAT (USA)