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Worked Examples in X-Ray Analysis

  • Book
  • © 1970

Overview

Authors:
  1. R. Jenkins
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  2. J. L. Vries
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Table of contents (47 chapters)

  1. Front Matter

    Pages i-xi
    Download chapter PDF

  2. Spectra

    1. Characteristic spectra Moseley’s law

      • R. Jenkins, J. L. de Vries
      Pages 1-3

    2. Characteristic spectra — Prediction of possible transitions

      • R. Jenkins, J. L. de Vries
      Pages 4-5

    3. Continuous spectra — use of Kramers’ formula

      • R. Jenkins, J. L. de Vries
      Pages 6-8

    4. Continuous radiation — Scattered radiation

      • R. Jenkins, J. L. de Vries
      Pages 9-11

  3. Instrumentation

    1. Detector resolution

      • R. Jenkins, J. L. de Vries
      Pages 12-13

    2. Dispersion as a function of ‘d’ spacing

      • R. Jenkins, J. L. de Vries
      Pages 14-15

    3. Choice of collimator/crystal combination

      • R. Jenkins, J. L. de Vries
      Pages 16-18

    4. Pulse height selection — crystal fluorescence

      • R. Jenkins, J. L. de Vries
      Pages 19-21

    5. Pulse height selection — pulse height variation

      • R. Jenkins, J. L. de Vries
      Pages 22-24

    6. Detectors — double plateaux

      • R. Jenkins, J. L. de Vries
      Pages 25-27

    7. Choice of detectors

      • R. Jenkins, J. L. de Vries
      Pages 28-29

    8. Count rate differences with Geiger and proportional counters

      • R. Jenkins, J. L. de Vries
      Pages 30-31

    9. Dispersion of the diffractometer

      • R. Jenkins, J. L. de Vries
      Pages 32-34

    10. Removal of sample fluorescence

      • R. Jenkins, J. L. de Vries
      Pages 35-39

    11. Spurious peaks in X-ray diffractograms

      • R. Jenkins, J. L. de Vries
      Pages 40-42

    12. Extra lines in X-ray diffractometry

      • R. Jenkins, J. L. de Vries
      Pages 43-45

  4. Counting Statistics

    1. Counting statistics — variation of standard deviation with counting time

      • R. Jenkins, J. L. de Vries
      Pages 46-47

    2. Estimation of error introduced by ignoring the background

      • R. Jenkins, J. L. de Vries
      Pages 48-50

    3. Trace analysis — derivation of detection limit expression

      • R. Jenkins, J. L. de Vries
      Pages 51-53
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Keywords

About this book

The purpose of this book is to provide the reader with a series of work­ ed examples in X -ray spectrometry and X -ray diffractometry, in such a way that each example can be treated either as a posed question, i. e. one to which the reader must himself provide an answer, or as a guide to the method of treating a similar problem. The latter, of course, also pro­ vides a check on the answer produced by the reader. Although much basic theory can be derived by study of this work the first intention of the book is not to provide a source of basic theoretical knowledge in X -ray analy­ sis. It is hoped that the book will be utilized more as a guide line in the tackling of theoretical and practical problems and as a means of estab­ lishing whether or not the reader is able to work out for himself a certain type of problem. For example, the series of examples on counting statis­ tics has been chosen in such a way that after working through and under­ standing these, the reader should be able to handle most of the calculations that he is likely to come up against in this area.

Bibliographic Information

  • Book Title: Worked Examples in X-Ray Analysis

  • Authors: R. Jenkins, J. L. Vries

  • DOI: https://doi.org/10.1007/978-1-4899-2647-0

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1970

  • Hardcover ISBN: 978-0-387-91068-0Due: 05 October 1983

  • Softcover ISBN: 978-1-4899-2649-4Published: 23 November 2013

  • eBook ISBN: 978-1-4899-2647-0Published: 20 December 2013

  • Edition Number: 1

  • Number of Pages: XI, 132

  • Topics: Quantum Physics

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