Worked Examples in X-Ray Analysis

  • Authors
  • R. Jenkins
  • J. L. de Vries

Table of contents

  1. Front Matter
    Pages i-xi
  2. Spectra

    1. R. Jenkins, J. L. de Vries
      Pages 1-3
    2. R. Jenkins, J. L. de Vries
      Pages 6-8
    3. R. Jenkins, J. L. de Vries
      Pages 9-11
  3. Instrumentation

    1. R. Jenkins, J. L. de Vries
      Pages 12-13
    2. R. Jenkins, J. L. de Vries
      Pages 14-15
    3. R. Jenkins, J. L. de Vries
      Pages 16-18
    4. R. Jenkins, J. L. de Vries
      Pages 19-21
    5. R. Jenkins, J. L. de Vries
      Pages 22-24
    6. R. Jenkins, J. L. de Vries
      Pages 25-27
    7. R. Jenkins, J. L. de Vries
      Pages 28-29
    8. R. Jenkins, J. L. de Vries
      Pages 30-31
    9. R. Jenkins, J. L. de Vries
      Pages 32-34
    10. R. Jenkins, J. L. de Vries
      Pages 35-39
    11. R. Jenkins, J. L. de Vries
      Pages 40-42
    12. R. Jenkins, J. L. de Vries
      Pages 43-45
  4. Counting Statistics

About this book

Introduction

The purpose of this book is to provide the reader with a series of work­ ed examples in X -ray spectrometry and X -ray diffractometry, in such a way that each example can be treated either as a posed question, i. e. one to which the reader must himself provide an answer, or as a guide to the method of treating a similar problem. The latter, of course, also pro­ vides a check on the answer produced by the reader. Although much basic theory can be derived by study of this work the first intention of the book is not to provide a source of basic theoretical knowledge in X -ray analy­ sis. It is hoped that the book will be utilized more as a guide line in the tackling of theoretical and practical problems and as a means of estab­ lishing whether or not the reader is able to work out for himself a certain type of problem. For example, the series of examples on counting statis­ tics has been chosen in such a way that after working through and under­ standing these, the reader should be able to handle most of the calculations that he is likely to come up against in this area.

Keywords

X-ray spectrometry

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4899-2647-0
  • Copyright Information Springer-Verlag New York 1970
  • Publisher Name Springer, New York, NY
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4899-2649-4
  • Online ISBN 978-1-4899-2647-0
  • About this book